Mehul D. Shroff

Orcid: 0000-0002-7664-8941

According to our database1, Mehul D. Shroff authored at least 5 papers between 2016 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2021
An efficient methodology to evaluate BEOL and MOL TDDB in advanced nodes.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020
Full-chip wire-oriented back-end-of-line TDDB hotspot detection and lifetime analysis.
Integr., 2020

2018
Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method.
IEEE Trans. Very Large Scale Integr. Syst., 2018

Fast Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

2016
Voltage-based electromigration immortality check for general multi-branch interconnects.
Proceedings of the 35th International Conference on Computer-Aided Design, 2016


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