An assessment of RTN-induced threshold voltage jitter. - Jianfu Zhang 001; Azrif Manut; Rui Gao 003; Mehzabeen Mehedi; Zhigang Ji; Weidong Zhang 002; John S. Marsland (ASICON, 2019)

A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. - Rui Gao 003; Mehzabeen Mehedi; Haibao Chen; Xinsheng Wang; Jianfu Zhang 001; Xiaoling Lin; Zhiyuan He; Yiqiang Chen 002; Dengyun Lei; Yun Huang; Yunfei En; Zhigang Ji; et al. (IRPS, 2020)

An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants. - Mehzabeen Mehedi; Kean Hong Tok; Jianfu Zhang 001; Zhigang Ji; Zengliang Ye; Weidong Zhang 002; John S. Marsland (IEEE Access, 2020)

An integrated method for extracting the statistical distribution of RTN time constants. - Mehzabeen Mehedi; Kean Hong Tok; Jian Fu Zhang 001; Zhigang Ji; Zengliang Ye; Weidong Zhang 002; John S. Marsland (ASICON, 2021)

On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude. - Mehzabeen Mehedi; Kean Hong Tok; Zengliang Ye; Jianfu Zhang 001; Zhigang Ji; Weidong Zhang 002; John S. Marsland (IEEE Access, 2021)