On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model. - Bernhard Bauer 003; Mouadh Ayache; Saleh Mulhem; Meirav Nitzan; Jyotika Athavale; Rainer Buchty; Mladen Berekovic (Computer, 2022)

Innovation Practices Track: VLSI Functional Safety. - Fei Su; Meirav Nitzan; Ankush Sethi; Vaibhav Kumar; Dan Alexandrescu (VTS, 2023)