Research on Influencing Factors of Chip Dynamic Current Distribution in IGBT Module. - Meiting Cui; Zhongyuan Chen; Hongji Li (iSPEC, 2023)

Measurement of Thermal Resistance of SiC MOSFET Module Based on Conduction Voltage Drop. - Zhongyuan Chen; Jiapeng Li; Rui Jin; Meiting Cui; Chunsheng Guo (IEEE Trans. Instrum. Meas., 2024)