An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM. - Randy W. Mann; Meixiong Zhao; Sanjay Parihar; Qun Gao; Ankur Arya; Carl Radens; Shesh Mani Pandey; Joseph Versaggi; Jack M. Higman; Rick Carter (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Bias-Dependent Variation in FinFET SRAM. - Randy W. Mann; Meixiong Zhao; Oh Sung Kwon; Xi Cao; Sanjay Parihar; Muhammed Ahosan Ul Karim; Jack M. Higman; Joseph Versaggi; Rick Carter (IEEE Trans. Very Large Scale Integr. Syst., 2020)