Scan chain clustering for test power reduction. - Melanie Elm; Hans-Joachim Wunderlich; Michael E. Imhof; Christian G. Zoellin; Jens Leenstra; Nicolas Mäding (DAC, 2008)

Scan Chain Organization for Embedded Diagnosis. - Melanie Elm; Hans-Joachim Wunderlich (DATE, 2008)

Test Encoding for Extreme Response Compaction. - Michael A. Kochte; Stefan Holst; Melanie Elm; Hans-Joachim Wunderlich (ETS, 2009)

On Determining the Real Output Xs by SAT-Based Reasoning. - Melanie Elm; Michael A. Kochte; Hans-Joachim Wunderlich (Asian Test Symposium, 2010)

BISD: Scan-based Built-In self-diagnosis. - Melanie Elm; Hans-Joachim Wunderlich (DATE, 2010)

Structural In-Field Diagnosis for Random Logic Circuits. - Alejandro Cook; Melanie Elm; Hans-Joachim Wunderlich; Ulrich Abelein (ETS, 2011)

Structural Test for Graceful Degradation of NoC Switches. - Atefe Dalirsani; Stefan Holst; Melanie Elm; Hans-Joachim Wunderlich (ETS, 2011)

Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs. - Alejandro Cook; Dominik Ull; Melanie Elm; Hans-Joachim Wunderlich; Helmut Randoll; Stefan Dohren (Asian Test Symposium, 2012)

Structural Test and Diagnosis for Graceful Degradation of NoC Switches. - Atefe Dalirsani; Stefan Holst; Melanie Elm; Hans-Joachim Wunderlich (J. Electron. Test., 2012)

Accurate X-Propagation for Test Applications by SAT-Based Reasoning. - Michael A. Kochte; Melanie Elm; Hans-Joachim Wunderlich (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)