Threshold voltage instability of nanoscale charge trapping non-volatile memory at steady phase. - Meng Chuan Lee; Hin Yong Wong; Lini Lee (Microelectron. Reliab., 2014)

Investigation on the origin of the anomalous tail bits on nitrided charge trap flash memory. - Meng Chuan Lee; Hin Yong Wong (Microelectron. Reliab., 2015)

Investigation on X-ray irradiation on nanoscale nitride based charge trapping flash memory devices. - Meng Chuan Lee; Hin Yong Wong (Microelectron. Reliab., 2017)