An Efficient Peak Power Reduction Technique for Scan Testing. - Meng-Fan Wu; Kai-Shun Hu; Jiun-Lang Huang (ATS, 2007)

PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment. - Yi-Tsung Lin; Meng-Fan Wu; Jiun-Lang Huang (ATS, 2008)

Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing. - Meng-Fan Wu; Jiun-Lang Huang; Xiaoqing Wen; Kohei Miyase (ITC, 2008)

LPTest: a Flexible Low-Power Test Pattern Generator. - Meng-Fan Wu; Kai-Shun Hu; Jiun-Lang Huang (J. Electron. Test., 2009)

Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment. - Meng-Fan Wu; Jiun-Lang Huang; Xiaoqing Wen; Kohei Miyase (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

Improved weight assignment for logic switching activity during at-speed test pattern generation. - Meng-Fan Wu; Hsin-Cheih Pan; Teng-Han Wang; Jiun-Lang Huang; Kun-Han Tsai; Wu-Tung Cheng (ASP-DAC, 2010)

Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing. - Chun-Yong Liang; Meng-Fan Wu; Jiun-Lang Huang (Asian Test Symposium, 2010)

A scalable quantitative measure of IR-drop effects for scan pattern generation. - Meng-Fan Wu; Kun-Han Tsai; Wu-Tung Cheng; Hsin-Cheih Pan; Jiun-Lang Huang; Augusli Kifli (ICCAD, 2010)

Analyses on spatiotemporal patterns of impervious surface coverage in Changsha metropolitan area. - Meng-Fan Wu; Bo Yang; Fei-Fei Hu; Liu-Wen Liao (Geoinformatics, 2015)

W-band OFDM RoF system with simple envelope detector down-conversion. - Che-Hao Li; Meng-Fan Wu; Chi-Hsiang Lin; Chun-Ting Lin (OFC, 2015)

Simple receiving scheme in 100-GHz DD OFDM RoF systems employing low-sampling-rate ADCs and digital preprocess. - Huan-Ching Liu; Chi-Hsiang Lin; Chun-Ting Lin; Chia-Chien Wei; Hou-Tzu Huang; Hsun-Hao Hsu; Meng-Fan Wu; Sien Chi (OFC, 2015)