Burn-In Stress Test of Analog CMOS ICs. - Chin-Long Wey; Meng-Yao Liu (Asian Test Symposium, 2004)

Design of a CMOS Operational Amplifier Amenable to Extreme Voltage Stress. - Shaolei Quan; Meng-Yao Liu; Chin-Long Wey (DFT, 2005)

Reliability enhancement of CMOS SRAMs. - Chin-Long Wey; Meng-Yao Liu; Shaolei Quan (MTDT, 2005)

Quantum visual multi-tone secret sharing scheme based on color encoding. - Meng-Yao Liu; Pei-Jun Zhao; Bin Yan 001; Jeng-Shyang Pan 001; Hong-Mei Yang (Signal Image Video Process., 2025)