A novel single poly-silicon EEPROM using trench floating gate. - Meng-Yi Wu; Shin-Chang Feng; Ya-Chin King (MTDT, 2005)

Highly reliable anti-fuse technology in sub-16nm technologies for security applications. - Rick Shih-Jye Shen; Hsin-Ming Chen; Meng-Yi Wu (ICICDT, 2016)

A PUF scheme using competing oxide rupture with bit error rate approaching zero. - Meng-Yi Wu; Tsao-Hsin Yang; Lun-Chun Chen; Chi-Chang Lin; Hao-Chun Hu; Fang-Ying Su; Chih-Min Wang; James Po-Hao Huang; Hsin-Ming Chen; Chris Chun-Hung Lu; Evans Ching-Song Yang; Rick Shih-Jye Shen (ISSCC, 2018)

Hardware Root-of-Trust Design Based on on-chip PUF for AIoT Applications. - Meng-Yi Wu (VLSI-DAT, 2022)