SDE-based software reliability additive models with masked data using ELS algorithm. - Jianfeng Yang; Ming Ding; Menglan He; Zhoutao Zheng; Nan Yang (J. King Saud Univ. Comput. Inf. Sci., 2024)

Layer similarity guiding few-shot Chinese style transfer. - Yumei Li 016; Guangfeng Lin; Menglan He; Dan Yuan; Kaiyang Liao (Vis. Comput., 2024)