Efficient Bayesian Yield Optimization Approach for Analog and SRAM Circuits. - Mengshuo Wang; Fan Yang 001; Changhao Yan; Xuan Zeng 001; Xiangdong Hu (DAC, 2017)

High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis. - Mengshuo Wang; Changhao Yan; Xin Li 001; Dian Zhou; Xuan Zeng 001 (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Taking Human out of Learning Applications: A Survey on Automated Machine Learning. - Quanming Yao; Mengshuo Wang; Hugo Jair Escalante; Isabelle Guyon; Yi-Qi Hu; Yufeng Li 008; Wei-Wei Tu; Qiang Yang 001; Yang Yu 001 (CoRR, 2018)

Efficient Yield Optimization for Analog and SRAM Circuits via Gaussian Process Regression and Adaptive Yield Estimation. - Mengshuo Wang; Wenlong Lv; Fan Yang 001; Changhao Yan; Wei Cai 003; Dian Zhou; Xuan Zeng 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

AutoCross: Automatic Feature Crossing for Tabular Data in Real-World Applications. - Yuanfei Luo; Mengshuo Wang; Hao Zhou; Quanming Yao; Wei-Wei Tu; Yuqiang Chen; Wenyuan Dai; Qiang Yang 001 (KDD, 2019)