A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. - Zhanglei Wang; Krishnendu Chakrabarty; Michael Bienek (ETS, 2007)

Deviation-Based LFSR Reseeding for Test-Data Compression. - Zhanglei Wang; Hongxia Fang; Krishnendu Chakrabarty; Michael Bienek (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)