Applications of optimal control theory to computer controller design: William S. Widnall: M.I.T. Press, Cambridge, Mass. Research monograph no. 48. (1968), 210 pp. - Michael D. Ciletti (Autom., 1969)

A Simplified Six-waveform Type Method for Delay Fault Testing. - Weiwei Mao; Michael D. Ciletti (DAC, 1989)

A Variable Observation Time Method for Testing Delay Faults. - Weiwei Mao; Michael D. Ciletti (DAC, 1990)

QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults. - Weiwei Mao; Ravi K. Gulati; Deepak K. Goel; Michael D. Ciletti (ICCAD, 1990)

Arrangement of latches in scan-path design to improve delay fault coverage. - Weiwei Mao; Michael D. Ciletti (ITC, 1990)

DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation. - Weiwei Mao; Michael D. Ciletti (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990)

Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage. - Weiwei Mao; Michael D. Ciletti (DAC, 1991)

A quantitative measure of robustness for delay fault testing. - Weiwei Mao; Michael D. Ciletti (EURO-DAC, 1992)

Robustness Enhancement and Detection Threshold Reduction in ATPG for Gate Delay Faults. - Weiwei Mao; Michael D. Ciletti (ITC, 1992)

Reducing correlation to improve coverage of delay faults in scan-path design. - Weiwei Mao; Michael D. Ciletti (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

ADM: A New Technique for the Simulation of CMOS Circuit Transients. - Scott vpn Tonningen; Michael D. Ciletti (ISCAS, 1995)