Scan Test Planning for Power Reduction. - Michael E. Imhof; Christian G. Zoellin; Hans-Joachim Wunderlich; Nicolas Mäding; Jens Leenstra (DAC, 2007)

Scan chain clustering for test power reduction. - Melanie Elm; Hans-Joachim Wunderlich; Michael E. Imhof; Christian G. Zoellin; Jens Leenstra; Nicolas Mäding (DAC, 2008)

Test Set Stripping Limiting the Maximum Number of Specified Bits. - Michael A. Kochte; Christian G. Zoellin; Michael E. Imhof; Hans-Joachim Wunderlich (DELTA, 2008)

Integrating Scan Design and Soft Error Correction in Low-Power Applications. - Michael E. Imhof; Hans-Joachim Wunderlich; Christian G. Zoellin (IOLTS, 2008)

Test exploration and validation using transaction level models. - Michael A. Kochte; Christian G. Zoellin; Michael E. Imhof; Rauf Salimi Khaligh; Martin Radetzki; Hans-Joachim Wunderlich; Stefano Di Carlo; Paolo Prinetto (DATE, 2009)

Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level. - Michael A. Kochte; Christian G. Zoellin; Rafal Baranowski; Michael E. Imhof; Hans-Joachim Wunderlich; Nadereh Hatami; Stefano Di Carlo; Paolo Prinetto (Asian Test Symposium, 2010)

System reliability evaluation using concurrent multi-level simulation of structural faults. - Michael A. Kochte; Christian G. Zoellin; Rafal Baranowski; Michael E. Imhof; Hans-Joachim Wunderlich; Nadereh Hatami; Stefano Di Carlo; Paolo Prinetto (ITC, 2010)

Embedded Test for Highly Accurate Defect Localization. - Abdullah Mumtaz; Michael E. Imhof; Stefan Holst; Hans-Joachim Wunderlich (Asian Test Symposium, 2011)

Soft error correction in embedded storage elements. - Michael E. Imhof; Hans-Joachim Wunderlich (IOLTS, 2011)

P-PET: Partial pseudo-exhaustive test for high defect coverage. - Abdullah Mumtaz; Michael E. Imhof; Hans-Joachim Wunderlich (ITC, 2011)

Efficient multi-level fault simulation of HW/SW systems for structural faults. - Rafal Baranowski; Stefano Di Carlo; Nadereh Hatami; Michael E. Imhof; Michael A. Kochte; Paolo Prinetto; Hans-Joachim Wunderlich; Christian G. Zoellin (Sci. China Inf. Sci., 2011)

OTERA: Online test strategies for reliable reconfigurable architectures - Invited paper for the AHS-2012 special session "Dependability by reconfigurable hardware". - Lars Bauer; Claus Braun; Michael E. Imhof; Michael A. Kochte; Hongyan Zhang 004; Hans-Joachim Wunderlich; Jörg Henkel (AHS, 2012)

Variation-Aware Fault Grading. - Alexander Czutro; Michael E. Imhof; J. Jiang; Abdullah Mumtaz; Matthias Sauer 002; Bernd Becker 001; Ilia Polian; Hans-Joachim Wunderlich (Asian Test Symposium, 2012)

Transparent structural online test for reconfigurable systems. - Mohamed Abdelfattah; Lars Bauer; Claus Braun; Michael E. Imhof; Michael A. Kochte; Hongyan Zhang 004; Jörg Henkel; Hans-Joachim Wunderlich (IOLTS, 2012)

Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test. - Alejandro Cook; Sybille Hellebrand; Michael E. Imhof; Abdullah Mumtaz; Hans-Joachim Wunderlich (LATW, 2012)

A pseudo-dynamic comparator for error detection in fault tolerant architectures. - D. A. Tran; Arnaud Virazel; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Michael E. Imhof; Hans-Joachim Wunderlich (VTS, 2012)

Synthesis of workload monitors for on-line stress prediction. - Rafal Baranowski; Alejandro Cook; Michael E. Imhof; Chang Liu 010; Hans-Joachim Wunderlich (DFTS, 2013)

Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures. - Hongyan Zhang 004; Lars Bauer; Michael A. Kochte; Eric Schneider; Claus Braun; Michael E. Imhof; Hans-Joachim Wunderlich; Jörg Henkel (ITC, 2013)

Test Strategies for Reliable Runtime Reconfigurable Architectures. - Lars Bauer; Claus Braun; Michael E. Imhof; Michael A. Kochte; Eric Schneider; Hongyan Zhang 004; Jörg Henkel; Hans-Joachim Wunderlich (IEEE Trans. Computers, 2013)

On Covering Structural Defects in NoCs by Functional Tests. - Atefe Dalirsani; Nadereh Hatami; Michael E. Imhof; Marcus Eggenberger; Gert Schley; Martin Radetzki; Hans-Joachim Wunderlich (ATS, 2014)

GUARD: GUAranteed Reliability in Dynamically Reconfigurable Systems. - Hongyan Zhang 004; Michael A. Kochte; Michael E. Imhof; Lars Bauer; Hans-Joachim Wunderlich; Jörg Henkel (DAC, 2014)

Bit-Flipping Scan - A unified architecture for fault tolerance and offline test. - Michael E. Imhof; Hans-Joachim Wunderlich (DATE, 2014)

Variation-aware deterministic ATPG. - Matthias Sauer 002; Ilia Polian; Michael E. Imhof; Abdullah Mumtaz; Eric Schneider; Alexander Czutro; Hans-Joachim Wunderlich; Bernd Becker 001 (ETS, 2014)

Structural Software-Based Self-Test of Network-on-Chip. - Atefe Dalirsani; Michael E. Imhof; Hans-Joachim Wunderlich (VTS, 2014)

High-Throughput Logic Timing Simulation on GPGPUs. - Stefan Holst; Michael E. Imhof; Hans-Joachim Wunderlich (ACM Trans. Design Autom. Electr. Syst., 2015)

Fault tolerance infrastructure and its reuse for offline testing: synergies of a unified architecture to cope with soft errors and hard faults. - Michael E. Imhof (2015)