Data exchange formats for testing. - Johannes Pfeifer; Michael G. Wahl; Hans Wojtkowiak (Microprocessing and Microprogramming, 1989)

Development of a new standard for test. - William W. Sebesta; Bas Verhelst; Michael G. Wahl (ITC, 1990)

EDIF Test - The Upcoming Standard for Test Data Transfers. - Michael G. Wahl; Carol Pyron (ITC, 1992)

Introducing multimedia in teaching of digital system design. - Peter Conradi; Ulrich Heinkel; Michael G. Wahl (MSE, 1997)

A Systematic Analysis of Reuse Strategies for Design of Electronic Circuits. - Manfred Koegst; Dieter Garte; Peter Conradi; Michael G. Wahl (DATE, 1998)

A VHDL SGRAM Model for the Validation Environment of a High Performance Graphic Processor. - Michael G. Wahl; Holger Völkel (DATE, 1998)

From DFT to systems test - a model based cost optimization tool. - Michael G. Wahl; Anthony P. Ambler; Christoph Maaß; Mohammed Rahman (DATE, 2001)

The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. - Michael G. Wahl; Sudipta Bhawmik; Kamran Zarrineh; Pradipta Ghosh; Scott Davidson 001; Peter Harrod (ITC, 2003)

A sophisticated memory test engine for LCD display drivers. - Oliver Spang; Hans Martin von Staudt; Michael G. Wahl (DATE, 2007)

Manufacturing and test assistance for 3D-Integrated heterogeneous systems. - Armin Grünewald; Michael G. Wahl; Rainer Brück 001 (3DIC, 2014)

Startup error detection and containment to improve the robustness of hybrid FlexRay networks. - Alexander Kordes; Bart Vermeulen; Abhijit K. Deb; Michael G. Wahl (DATE, 2014)

Site dependencies in a multisite testing environment. - Thomas Lehner; Andreas Kuhr; Michael G. Wahl; Rainer Brück 001 (ETS, 2014)

Cost modeling and analysis for the design, manufacturing and test of 3D-ICs. - Armin Grünewald; Michael G. Wahl; Rainer Brück 001 (3DIC, 2015)

AAT Meets Virtual Reality. - Tanja Joan Eiler; Armin Grünewald; Michael G. Wahl; Rainer Brück 001 (VISIGRAPP (Revised Selected Papers), 2019)

Yield prediction in semiconductor manufacturing using an AI-based cascading classification system. - Peter Stich; Michael G. Wahl; Peter Czerner; Christian Weber 003; Madjid Fathi (EIT, 2020)

Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-based predictions. - Peter Stich; Rebecca Busch; Michael G. Wahl; Christian Weber 003; Madjid Fathi (EIT, 2021)

FAST GDRNPP: Improving the Speed of State-of-the-Art 6D Object Pose Estimation. - Thomas Pöllabauer; Ashwin Pramod; Volker Knauthe; Michael G. Wahl (CoRR, 2024)