Efficient Pattern Mapping for Deterministic Logic BIST. - Valentin Gherman; Hans-Joachim Wunderlich; Harald P. E. Vranken; Friedrich Hapke; Michael Wittke; Michael Garbers (ITC, 2004)

Implementing a Scheme for External Deterministic Self-Test. - Abdul Wahid Hakmi; Hans-Joachim Wunderlich; Valentin Gherman; Michael Garbers; Jürgen Schlöffel (VTS, 2005)

Synthesis of irregular combinational functions with large don't care sets. - Valentin Gherman; Hans-Joachim Wunderlich; R. D. Mascarenhas; Jürgen Schlöffel; Michael Garbers (ACM Great Lakes Symposium on VLSI, 2007)

Deterministic logic BIST for transition fault testing. - Valentin Gherman; Hans-Joachim Wunderlich; Jürgen Schlöffel; Michael Garbers (IET Comput. Digit. Tech., 2007)

Affordable and Comprehensive Testing of 3-D Stacked Die Devices. - Jean-François Côté; Jeff Fan; Sean Shen; Givargis Danialy 001; Marcin Lipinski; Michael Garbers; Wu Yang; Martin Keim; Andreas Glowatz; Joe Reynick; Ayush Patel; Joanna Michna (IEEE Des. Test, 2022)