Semiconductors in high temperature applications - a future trend in automotive industry. - Michael Goroll; Reinhard Pufall; Werner Kanert; Boris Plikat (Microelectron. Reliab., 2004)

ESD protection structure qualification - a new approach for release for automotive applications. - Michael Goroll; Werner Kanert; Reinhard Pufall (Microelectron. Reliab., 2006)

Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. - Stefano Aresu; Werner Kanert; Reinhard Pufall; Michael Goroll (Microelectron. Reliab., 2007)

Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices. - Michael Goroll; Werner Kanert; Reinhard Pufall; Stefano Aresu (Microelectron. Reliab., 2007)

NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. - Stefano Aresu; Reinhard Pufall; Michael Goroll; Wolfgang Gustin (Microelectron. Reliab., 2008)

New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. - Michael Goroll; Reinhard Pufall; Stefano Aresu; Wolfgang Gustin (Microelectron. Reliab., 2008)

Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. - Reinhard Pufall; Werner Kanert; Stefano Aresu; Michael Goroll (Microelectron. Reliab., 2008)

New aspects in characterization of adhesion of moulding compounds on different surfaces by using a simple button-shear-test method for lifetime prediction of power devices. - Michael Goroll; Reinhard Pufall (Microelectron. Reliab., 2010)

Determination of adhesion and delamination prediction for semiconductor packages by using Grey Scale Correlation and Cohesive Zone Modelling. - Michael Goroll; Reinhard Pufall (Microelectron. Reliab., 2012)

Degradation of moulding compounds during highly accelerated stress tests - A simple approach to study adhesion by performing button shear tests. - Reinhard Pufall; Michael Goroll; Joachim Mahler; Werner Kanert; M. Bouazza; Olaf Wittler; Rainer Dudek (Microelectron. Reliab., 2012)

Acoustic detection of micro-cracks in small electronic devices. - Georg Michael Reuther; Reinhard Pufall; Michael Goroll (Microelectron. Reliab., 2014)