Ein Algorithmus für die Diagrammtechnik der Greenschen Funktion. - Michael Gössel (J. Inf. Process. Cybern., 1969)

Abstandsmatrix eines Zeichens. - Michael Gössel (J. Inf. Process. Cybern., 1970)

Versuch einer automatentheoretischen Beschreibung von Selektionsprozessen. - K. Bellmann; Michael Gössel (Acta Cybern., 1971)

Über die Reduktion eines erweiterten linearen Automaten. - Michael Gössel (J. Inf. Process. Cybern., 1971)

Zur minimalen Modellbildung bei linearen diskreten Systemen. - Michael Gössel (J. Inf. Process. Cybern., 1971)

Zur Realisierung stochastischer Automaten aus Zufallsgeneratoren und determinierten Automaten. - Michael Gössel; Heinz D. Modrow (J. Inf. Process. Cybern., 1972)

Über Momente der Autokorrelationsfunktion eines Zeichens. - Michael Gössel; Hans-Volker Pürschel (J. Inf. Process. Cybern., 1972)

Über stabile Umkehrautomaten linearer Automaten. - Michael Gössel (J. Inf. Process. Cybern., 1973)

Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten I. - Heinz D. Modrow; Michael Gössel (J. Inf. Process. Cybern., 1973)

Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten II. - Heinz D. Modrow; Michael Gössel (J. Inf. Process. Cybern., 1973)

Ein verallgemeinertes Superpositionsprinzig für binäre Automaten. - Michael Gössel; Heinz D. Modrow (J. Inf. Process. Cybern., 1975)

Verallgemeinerte Superposition bei binären Automaten. - Michael Gössel; Heinz D. Modrow (Acta Cybern., 1977)

On the Characterization of Linear and Linearizable Automata by a Superposition Principle. - Michael Gössel; Reinhard Pöschel (Math. Syst. Theory, 1977)

Invariant Relations for Automata - A Proposal. - Michael Gössel; Reinhard Pöschel (J. Inf. Process. Cybern., 1980)

Bemerkung über die Existenz von Signaturregistern zur Erkennung geradzahliger Fehler. - Michael Gössel (Elektron. Rechenanlagen, 1983)

Sets of Permutations and Their Realization by Permutation Networks. - Ferdinand Börner; Reinhard Pöschel; Michael Gössel (J. Inf. Process. Cybern., 1985)

Memories for Parallel Subtree-Access. - Michael Gössel; R. Rebel (Parallel Algorithms and Architectures, 1987)

Parallel memories for straight line and rectangle access. - Michael Gössel; V. V. Kaversnev; Burghard Rebel (Parcella, 1988)

Bitgenaue schnelle Arithmethik mit dem Bildverarbeitunssystem BVS A 6472. - Wolfgang Luth; Rolf-Jürgen Vilser; Norbert Eichhorn; Michael Gössel (Angew. Inform., 1988)

Parallel Access, to rectangles. - Michael Gössel; Burghard Rebel (Recent Issues in Pattern Analysis and Recognition, 1989)

Parallel computing of line-codings by use of a display processor system and the parallel determination of a discrete curvature. - Michael Gössel; J. Saedler (Recent Issues in Pattern Analysis and Recognition, 1989)

Linear image operations on the A6472 image processing system by use of the residue arithmetics. - Wolfgang Luth; Michael Gössel (Recent Issues in Pattern Analysis and Recognition, 1989)

Parallel matrix multiplication on an array-logical processor. - Rolf-Jürgen Vilser; Reiner Creutzburg; Hans-Jörg Grundmann; Michael Gössel (Recent Issues in Pattern Analysis and Recognition, 1989)

Optimal Error Detection Circuits for Sequential Circuits with Observable States. - Michael Gössel (Fault-Tolerant Computing Systems, 1991)

Pseudoduplication of floating-point addition. A method of compiler generated checking of permanent hardware faults. - Wolfgang Hahn; Michael Gössel (VTS, 1991)

Self-testing and self-checking combinational circuits with weakly independent outputs. - Egor S. Sogomonyan; Michael Gössel (VTS, 1992)

Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. - Egor S. Sogomonyan; Michael Gössel (DFT, 1993)

Monitoring BIST by covers. - Michael Gössel; Helmut Jürgensen (EURO-DAC, 1993)

Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. - Michael Gössel; Egor S. Sogomonyan (VLSI, 1993)

Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. - Egor S. Sogomonyan; Michael Gössel (J. Electron. Test., 1993)

Design of Cover Circuits for Monitoring the Output of a MISA. - T. Bogue; Helmut Jürgensen; Michael Gössel (DFT, 1994)

Detection of Permanent Hardware Faults of a Floating Point Adder by Pseudoduplication. - Stefan Gerber 002; Michael Gössel (EDCC, 1994)

Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. - Michael Gössel; Egor S. Sogomonyan (VTS, 1994)

BIST with negligible aliasing through random cover circuits. - T. Bogue; Helmut Jürgensen; Michael Gössel (ASP-DAC, 1995)

Self-dual parity checking-A new method for on-line testing. - Vladimir V. Saposhnikov; Alexej Dmitriev; Michael Gössel; Valerij V. Saposhnikov (VTS, 1996)

Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. - Egor S. Sogomonyan; Michael Gössel (VTS, 1996)

A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. - Michael Gössel; Egor S. Sogomonyan (J. Electron. Test., 1996)

Self-Checking Comparator with One Periodic Output. - Sandip Kundu; Egor S. Sogomonyan; Michael Gössel; Steffen Tarnick (IEEE Trans. Computers, 1996)

Code-Disjoint Circuits for Parity Circuits. - Hendrik Hartje; Michael Gössel; Egor S. Sogomonyan (Asian Test Symposium, 1997)

On-line error detection for finite field multipliers. - Michael Gössel; Sebastian T. J. Fenn; David Taylor (DFT, 1997)

A linear code-preserving signature analyzer COPMISR. - Andrzej Hlawiczka; Michael Gössel; Egor S. Sogomonyan (VTS, 1997)

Self-Dual Duplication for Error Detection. - Vladimir V. Saposhnikov; Valerij V. Saposhnikov; Alexej Dmitriev; Michael Gössel (Asian Test Symposium, 1998)

Built-In Self-Test with an Alternating Output. - T. Bogue; Michael Gössel; Helmut Jürgensen; Yervant Zorian (DATE, 1998)

A Structural Approach for Space Compaction for Concurrent Checking and BIST. - Markus Seuring; Michael Gössel; Egor S. Sogomonyan (VTS, 1998)

On-Line Error Detection for Bit-Serial Multipliers in GF(2m). - Sebastian T. J. Fenn; Michael Gössel; Mohammed Benaissa; David Taylor (J. Electron. Test., 1998)

A New Design Method for Self-Checking Unidirectional Combinational Circuits. - Valerij V. Saposhnikov; Andrej A. Morosov; Vladimir V. Saposhnikov; Michael Gössel (J. Electron. Test., 1998)

Self-Checking Combinational Circuits with Unidirectionally Independent Outputs. - Andrej A. Morosov; Valerij V. Saposhnikov; Vladimir V. Saposhnikov; Michael Gössel (VLSI Design, 1998)

A Structural Approach for Space Compaction for Sequential Circuits. - Markus Seuring; Michael Gössel (DFT, 1999)

Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. - Adit D. Singh; Egor S. Sogomonyan; Michael Gössel; Markus Seuring (ITC, 1999)

A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. - Michael Gössel; Andrej A. Morosov; Egor S. Sogomonyan (VTS, 1999)

A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits. - Markus Seuring; Michael Gössel (WIA, 1999)

Experimental Results for Self-Dual Multi-Output Combinational Circuits. - Vladimir V. Saposhnikov; V. Moshanin; Valerij V. Saposhnikov; Michael Gössel (J. Electron. Test., 1999)

A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. - Egor S. Sogomonyan; Adit D. Singh; Michael Gössel (J. Electron. Test., 1999)

A New Method of Redundancy Addition for Circuit Optimization. - Vitalij Ocheretnij; Michael Gössel; Vladimir V. Saposhnikov; Valerij V. Saposhnikov (EUROMICRO, 2000)

Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes. - Debaleena Das; Nur A. Touba; Markus Seuring; Michael Gössel (IOLTW, 2000)

A New Method for Concurrent Checking by Use of a 1-out-of-4 Code. - Michael Gössel; Alexej Dmitriev; Vladimir V. Saposhnikov; Valerij V. Saposhnikov (IOLTW, 2000)

New Self-Checking Circuits by Use of Berger-Codes. - Andrej A. Morosov; Valerij V. Saposhnikov; Vladimir V. Saposhnikov; Michael Gössel (IOLTW, 2000)

Zero-Aliasing Space Compression using a Single Periodic Output and its Application to Testing of Embedded Cores. - Bhargab B. Bhattacharya; Alexej Dmitriev; Michael Gössel (VLSI Design, 2000)

New Self-dual Circuits for Error Detection and Testing. - Alexej Dmitriev; Valerij V. Saposhnikov; Vladimir V. Saposhnikov; Michael Gössel; V. Moshanin; Andrej A. Morosov (VLSI Design, 2000)

Synthesis of single-output space compactors with application to scan-based IP cores. - Bhargab B. Bhattacharya; Alexej Dmitriev; Michael Gössel; Krishnendu Chakrabarty (ASP-DAC, 2001)

Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA. - Michael Gössel; Vitalij Ocheretnij; S. Chakrabarty (Asian Test Symposium, 2001)

A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. - Vitalij Ocheretnij; Egor S. Sogomonyan; Michael Gössel (Asian Test Symposium, 2001)

Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. - Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan (IOLTW, 2001)

Design of Parameterizable Error-Propagating Space Compactors for Response Observation. - Andrej A. Morosov; Michael Gössel; Krishnendu Chakrabarty; Bhargab B. Bhattacharya (VTS, 2001)

Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. - Egor S. Sogomonyan; Andrej A. Morosov; Jan Rzeha; Michael Gössel; Adit D. Singh (VTS, 2001)

Robust Space Compaction of Test Responses. - Alexej Dmitriev; Michael Gössel; Krishnendu Chakrabarty (Asian Test Symposium, 2002)

An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. - Chunsheng Liu; Krishnendu Chakrabarty; Michael Gössel (DATE, 2002)

Partially Duplicated Code-Disjoint Carry-Skip Adder. - Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan (DFT, 2002)

A New Self-Checking Code-Disjoint Carry-Skip Adder. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (IOLTW, 2002)

Scan-Path with Directly Duplicated and Inverted Duplicated Registers. - Michael Gössel; Egor S. Sogomonyan; Adit D. Singh (VTS, 2002)

Synthesis of single-output space compactors for scan-based sequential circuits. - Bhargab B. Bhattacharya; Alexej Dmitriev; Michael Gössel; Krishnendu Chakrabarty (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

Parity-Based Concurrent Error Detection of Substitution-Permutation Network Block Ciphers. - Ramesh Karri; Grigori Kuznetsov; Michael Gössel (CHES, 2003)

Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. - Kartik Mohanram; Egor S. Sogomonyan; Michael Gössel; Nur A. Touba (IOLTS, 2003)

A Modulo p Checked Self-Checking Carry Select Adder. - Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan; Daniel Marienfeld (IOLTS, 2003)

Parity-Based Concurrent Error Detection in Symmetric Block Ciphers. - Ramesh Karri; Grigori Kuznetsov; Michael Gössel (ITC, 2003)

Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output. - Bhargab B. Bhattacharya; Alexej Dmitriev; Michael Gössel (IEEE Trans. Computers, 2003)

Multimode scan: Test per clock BIST for IP cores. - Adit D. Singh; Markus Seuring; Michael Gössel; Egor S. Sogomonyan (ACM Trans. Design Autom. Electr. Syst., 2003)

Complementary Circuits for On-Line Detection for 1-out-of-3 Codes. - Andrej A. Morosov; Michael Gössel; Valerij V. Saposhnikov; Vladimir V. Saposhnikov (ARCS Workshops, 2004)

Self-checking Carry-selectAdder with Sum-bit Duplication. - Egor S. Sogomonyan; Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel (ARCS Workshops, 2004)

Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. - Andreas Leininger; Michael Gössel; Peter Muhmenthaler (DATE, 2004)

A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. - Egor S. Sogomonyan; Daniel Marienfeld; Vitalij Ocheretnij; Michael Gössel (DATE, 2004)

A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (ETS, 2004)

Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. - Vitalij Ocheretnij; Daniel Marienfeld; Egor S. Sogomonyan; Michael Gössel (IOLTS, 2004)

Necessary and Sufficient Conditions for the Existence of Totally Self-Checking Circuits. - Valerij V. Saposhnikov; Vladimir V. Saposhnikov; Andrej A. Morosov; Michael Gössel (IOLTS, 2004)

Low Cost Concurrent Error Detection for the Advanced Encryption Standard. - Kaijie Wu 001; Ramesh Karri; Grigori Kuznetsov; Michael Gössel (ITC, 2004)

A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. - Michael Gössel; Krishnendu Chakrabarty; Vitalij Ocheretnij; Andreas Leininger (J. Electron. Test., 2004)

New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (Asian Test Symposium, 2005)

On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations. - Vitalij Ocheretnij; G. Kouznetsov; Ramesh Karri; Michael Gössel (IOLTS, 2005)

Test set enrichment using a probabilistic fault model and the theory of output deviations. - Zhanglei Wang; Krishnendu Chakrabarty; Michael Gössel (DATE, 2006)

On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. - Frank Poehl; Jan Rzeha; Matthias Beck; Michael Gössel; Ralf Arnold; Peter Ossimitz (ETS, 2006)

A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. - Daniel Marienfeld; Egor S. Sogomonyan; Vitalij Ocheretnij; Michael Gössel (IOLTS, 2006)

Modulo p=3 Checking for a Carry Select Adder. - Vitalij Ocheretnij; Michael Gössel; Egor S. Sogomonyan; Daniel Marienfeld (J. Electron. Test., 2006)

Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. - Andreas Leininger; Martin Fischer 002; Michael Richter 002; Michael Gössel (ITC, 2007)

On-chip evaluation, compensation and storage of scan diagnosis data. - Frank Poehl; Matthias Beck; Ralf Arnold; Jan Rzeha; Thomas Rabenalt; Michael Gössel (IET Comput. Digit. Tech., 2007)

Accelerated Shift Registers for X-tolerant Test Data Compaction. - Martin Hilscher; Michael Braun; Michael Richter 002; Andreas Leininger; Michael Gössel (ETS, 2008)

New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. - Michael Richter 002; Klaus Oberländer; Michael Gössel (IOLTS, 2008)

A Non-linear Split Error Detection Code. - Michael Gössel; Egor S. Sogomonyan (Fundam. Informaticae, 2008)

Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. - Frank-Uwe Faber; Matthias Beck; Markus Rudack; Olivier Barondeau; Thomas Rabenalt; Michael Gössel; Andreas Leininger (ETS, 2009)

Concurrent checking with split-parity codes. - Michael Richter 002; Michael Gössel (IOLTS, 2009)

X-tolerant Test Data Compaction with Accelerated Shift Registers. - Martin Hilscher; Michael Braun; Michael Richter 002; Andreas Leininger; Michael Gössel (J. Electron. Test., 2009)

High Performance Compaction for Test Responses with Many Unknowns. - Thomas Rabenalt; Michael Richter 002; Michael Gössel (Asian Test Symposium, 2010)

Reducing the area overhead of TMR-systems by protecting specific signals. - Michael Augustin; Michael Gössel; Rolf Kraemer (IOLTS, 2010)

Implementation of Selective Fault Tolerance with conventional synthesis tools. - Michael Augustin; Michael Gössel; Rolf Kraemer (DDECS, 2011)

Selective fault tolerance for finite state machines. - Michael Augustin; Michael Gössel; Rolf Kraemer (IOLTS, 2011)

Masking of X-Values by Use of a Hierarchically Configurable Register. - Thomas Rabenalt; Michael Gössel; Andreas Leininger (J. Electron. Test., 2011)

Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. - Thomas Rabenalt; Michael Richter 002; Frank Poehl; Michael Gössel (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

A new method for correcting time and soft errors in combinational circuits. - Egor S. Sogomonyan; Stefan Weidling; Michael Gössel (DDECS, 2013)

Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection. - Stefan Weidling; Egor S. Sogomonyan; Michael Gössel (DSD, 2013)

Triple error detection for Imai-Kamiyanagi codes based on subsyndrome computations. - Christian Badack; Michael Gössel (ETS, 2014)

Modified DEC BCH codes for parallel correction of 3-bit errors comprising a pair of adjacent errors. - Christian Badack; Thomas Kern; Michael Gössel (IOLTS, 2014)

Improved circuitry for soft error correction in combinational logic in pipelined designs. - Milos Krstic; Stefan Weidling; Vladimir Petrovic; Michael Gössel (IOLTS, 2014)

Fault tolerant linear state machines. - Stefan Weidling; Michael Gössel (LATW, 2014)

Möglichkeiten der Modellierung von Fehlern in MLC-Flash-Speichern durch Fehlergraphen. - Günther Nieß; Thomas Kern; Michael Gössel (GI-Jahrestagung, 2015)

A new 3-bit burst-error correcting code. - Alexander Klockmann; Georg Georgakos; Michael Gössel (IOLTS, 2017)

Regular LPDC Codes with Guaranteed Minimal Hamming Distance. - Paul-Patrick Nordmann; Michael Gössel (J. Autom. Lang. Comb., 2018)

A New DEC/TED Code for Fast Correction of 2-Bit-Errors. - Paul-Patrick Nordmann; Michael Gössel (IOLTS, 2019)

A New Decoding Method for Double Error Correcting Cross Parity Codes. - Georg Duchrau; Michael Gössel (IOLTS, 2022)

Modified Cross Parity Codes for Adjacent Double Error Correction. - Georg Duchrau; Michael Gössel (ARCS, 2023)

Determination of Optimal H-Matrices for 2-Bit Error Correcting Codes. - Alexander Benedict Behrens; Michael Gössel (ARCS, 2024)