Accelerated Fault Simulation and Fault Grading in Combinational Circuits. - Kurt Antreich; Michael H. Schulz (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1987)

Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität - Michael H. Schulz (Springer, 1988)

Advanced automatic test pattern generation and redundancy identification techniques. - Michael H. Schulz; Elisabeth Auth (FTCS, 1988)

SOCRATES: a highly efficient automatic test pattern generation system. - Michael H. Schulz; Erwin Trischler; Thomas M. Sarfert (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

Parallel Pattern Fault Simulation of Path Delay Faults. - Michael H. Schulz; Franz Fink; Karl Fuchs (DAC, 1989)

Advanced automatic test pattern generation techniques for path delay faults. - Michael H. Schulz; Karl Fuchs; Franz Fink (FTCS, 1989)

Hierarchical Test Pattern Generation Based on High-Level Primitives. - Thomas M. Sarfert; Remo G. Markgraf; Erwin Trischler; Michael H. Schulz (ITC, 1989)

Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits. - Michael H. Schulz; Elisabeth Auth (ITC, 1989)

Improved deterministic test pattern generation with applications to redundancy identification. - Michael H. Schulz; Elisabeth Auth (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989)

Ein neues, effizientes Verfahren zum Testpunkteeinbau in kombinatorischen Schaltungen. - Bernhard H. Seiß; Michael H. Schulz (Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme, 1990)

A Test-Pattern-Generation Algorithm for Sequential Circuits. - Elisabeth Auth; Michael H. Schulz (IEEE Des. Test Comput., 1991)

DYNAMITE: an efficient automatic test pattern generation system for path delay faults. - Karl Fuchs; Franz Fink; Michael H. Schulz (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991)

Prüfgerechter Entwurf und Test hochintegrierter Schaltungen. - Hans-Joachim Wunderlich; Michael H. Schulz (Inform. Spektrum, 1992)

Robust and Nonrobust Path Delay Fault Simulation by Parallel Processing of Patterns. - Franz Fink; Karl Fuchs; Michael H. Schulz (IEEE Trans. Computers, 1992)

A hierarchical test pattern generation system based on high-level primitives. - Thomas M. Sarfert; Remo G. Markgraf; Michael H. Schulz; Erwin Trischler (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)