Multiple-time-instant 2D thermal mapping during a single ESD event. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Michael Heer; Dionyz Pogany; Marie Denison; Nils Jensen; Matthias Stecher; Gerhard Groos; Erich Gornik (Microelectron. Reliab., 2004)

Automated setup for thermal imaging and electrical degradation study of power DMOS devices. - Michael Heer; Viktor Dubec; M. Blaho; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Marie Denison; Matthias Stecher; Gerhard Groos (Microelectron. Reliab., 2005)

Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. - Michael Heer; Viktor Dubec; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; M. Frank; A. Konrad; J. Schulz (Microelectron. Reliab., 2006)

Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. - Michael Heer; Sergey Bychikhin; W. Mamanee; Dionyz Pogany; A. Heid; P. Grombach; M. Klaussner; Winfried Soppa; Bernd Ramler (Microelectron. Reliab., 2007)

Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications. - Michael Heer; P. Grombach; A. Heid; Dionyz Pogany (Microelectron. Reliab., 2008)

Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. - Georg Haberfehlner; Sergey Bychikhin; Viktor Dubec; Michael Heer; A. Podgaynaya; M. Pfost; Matthias Stecher; Erich Gornik; Dionyz Pogany (Microelectron. Reliab., 2009)

Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. - Michael Heer; Krzysztof Domanski; Kai Esmark; Ulrich Glaser; Dionyz Pogany; Erich Gornik; Wolfgang Stadler (Microelectron. Reliab., 2009)

Application of transient interferometric mapping method for ESD and latch-up analysis. - Dionyz Pogany; Sergey Bychikhin; Michael Heer; W. Mamanee; Erich Gornik (Microelectron. Reliab., 2011)

ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique. - Matteo Rigato; Clément Fleury; Michael Heer; Mattia Capriotti; Werner Simbürger; Dionyz Pogany (Microelectron. Reliab., 2015)