Testability-Preserving Circuit Transformations. - Michael J. Bryan; Srinivas Devadas; Kurt Keutzer (ICCAD, 1990)

Necessary and sufficient conditions for hazard-free robust transistor stuck-open-fault testability in multilevel networks. - Michael J. Bryan; Srinivas Devadas; Kurt Keutzer (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

Analysis and Design of Regular Structures for Robust Dynamic Fault Testability. - Michael J. Bryan; Srinivas Devadas; Kurt Keutzer (VLSI Design, 1993)