Orthogonal Defect Classification - A Concept for In-Process Measurements. - Ram Chillarege; Inderpal S. Bhandari; Jarir K. Chaar; Michael J. Halliday; Diane S. Moebus; Bonnie K. Ray; Man-Yuen Wong (IEEE Trans. Software Eng., 1992)

On the Evaluation of Software Inspections and Tests. - Jarir K. Chaar; Michael J. Halliday; Inderpal S. Bhandari; Ram Chillarege (ITC, 1993)

A Case Study of Software Process Improvement During Development. - Inderpal S. Bhandari; Michael J. Halliday; Eric Tarver; David Brown; Jarir K. Chaar; Ram Chillarege (IEEE Trans. Software Eng., 1993)

In-Process Evaluation for Software Inspection and Test. - Jarir K. Chaar; Michael J. Halliday; Inderpal S. Bhandari; Ram Chillarege (IEEE Trans. Software Eng., 1993)

In-Process Improvement through Defect Data Interpretation. - Inderpal S. Bhandari; Michael J. Halliday; Jarir K. Chaar; Ram Chillarege; K. Jones; J. S. Atkinson; Cleo Lepori-Costello; P. Y. Jasper; E. D. Tarver; C. C. Lewis; M. Yonezawa (IBM Syst. J., 1994)

Experiences in transferring a software process improvement methodology to production laboratories. - Michael J. Halliday; Inderpal S. Bhandari; Jarir K. Chaar; Ram Chillarege (J. Syst. Softw., 1994)