Electromagnetic characterization of layered materials via direct and de-embed methods. - Michael J. Havrilla; Dennis P. Nyquist (IEEE Trans. Instrum. Meas., 2006)

A compact passive broadband hexagonal spiral antenna array for VHF remote sensing. - Richard J. Barton; Peter J. Collins; Paul E. Crittenden; Michael J. Havrilla; Andrew J. Terzuoli (IGARSS, 2007)

Fabrication of Multi-Scale Triangular Patch High Impedance Ground Planes to Improve the Bandwidth of Conformal Bow-Tie Antennas for Remote Sensing. - Bora Cakiroglu; Peter J. Collins; Michael J. Havrilla; Kubilay Sertel; Andrew J. Terzuoli (IGARSS (4), 2008)

A Novel Method for Determining the R-Card Sheet Impedance Using the Transmission Coefficient Measured in Free-Space or Waveguide Systems. - Milo W. Hyde; Michael J. Havrilla; Paul E. Crittenden (IEEE Trans. Instrum. Meas., 2009)

Material Classification of an Unknown Object Using Turbulence-Degraded Polarimetric Imagery. - Milo W. Hyde; Stephen C. Cain; Jason D. Schmidt; Michael J. Havrilla (IEEE Trans. Geosci. Remote. Sens., 2011)

Two-Iris Method for the Electromagnetic Characterization of Conductor-Backed Absorbing Materials Using an Open-Ended Waveguide Probe. - Gary D. Dester; Edward J. Rothwell; Michael J. Havrilla (IEEE Trans. Instrum. Meas., 2012)

Characterization of Biaxial Anisotropic Material Using a Reduced Aperture Waveguide. - Benjamin R. Crowgey; Ozgur Tuncer; Junyan Tang; Edward J. Rothwell; Balasubramaniam Shanker; Leo C. Kempel; Michael J. Havrilla (IEEE Trans. Instrum. Meas., 2013)

Broadband Characterization of Materials Using a Dual-Ridged Waveguide. - Milo W. Hyde; Michael J. Havrilla; Andrew E. Bogle; Nathan J. Lehman (IEEE Trans. Instrum. Meas., 2013)

Analysis and numerical solution of transient electromagnetic scattering from two cavities. - Richard Uber; Aihua Wood; Michael J. Havrilla (J. Comput. Phys., 2017)

High-Temperature RF Material Characterization Using a Dual-Chambered Rectangular Waveguide Fixture. - Andrew E. Bogle; Milo W. Hyde; Michael J. Havrilla; Jeffrey S. Sovern (IEEE Trans. Instrum. Meas., 2017)

A Triaxial Applicator for the Measurement of the Electromagnetic Properties of Materials. - Saranraj Karuppuswami; Edward J. Rothwell; Premjeet Chahal; Michael J. Havrilla (Sensors, 2018)

Nondestructive Electromagnetic Characterization of Uniaxial Sheet Media Using a Two-Flanged Rectangular Waveguide Probe. - Neil Rogers; Michael J. Havrilla; Milo W. Hyde; Alexander Knisely (IEEE Trans. Instrum. Meas., 2020)