Test of Digital Transversal Filters. - F. Matthiesen; Michael J. Ohletz (ITC, 1985)

Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits. - Christian Sebeke; J. P. Teixeira; Michael J. Ohletz (ED&TC, 1995)

Realistic-Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits. - Michael J. Ohletz (ITC, 1996)

Defect-oriented testing of analogue and mixed signal ICs. - Marcelino B. Santos; Fernando M. Gonçalves; Michael J. Ohletz; João Paulo Teixeira 001 (ICECS, 1998)

A Design for Testability Study on a High Performance Automatic Gain Control Circuit. - Andreas Lechner; Andrew Richardson 001; B. Hermes; Michael J. Ohletz (VTS, 1998)

Static and dynamic on-chip test response evaluation using a two-mode comparator. - Daniela De Venuto; Michael J. Ohletz; G. Matarrese (ETW, 2000)

On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages. - Daniela De Venuto; Michael J. Ohletz (J. Electron. Test., 2001)

Testing of Analogue Circuits via (Standard) Digital Gates. - Daniela De Venuto; Michael J. Ohletz; Bruno Riccò (ISQED, 2002)

Digital Window Comparator DfT Scheme for Mixed-Signal ICs. - Daniela De Venuto; Michael J. Ohletz; Bruno Riccò (J. Electron. Test., 2002)

Self-positioning digital window comparators for mixed-signal DfT. - Daniela De Venuto; Michael J. Ohletz; Bruno Riccò (ETFA (1), 2003)

Automatic Repositioning Technique for Digital Cell Based Window Comparators and Implementation within Mixed-Signal DfT Schemes. - Daniela De Venuto; Michael J. Ohletz; Bruno Riccò (ISQED, 2003)

Floating body effects model for fault simulation of fully depleted CMOS/SOI circuits. - Daniela De Venuto; Michael J. Ohletz (Microelectron. J., 2003)

Design, qualification and production of integrated sensor interface circuits for high-quality automotive applications. - Michael J. Ohletz; F. Schulze (Microelectron. J., 2009)