An Intelligent RAM with Serial I/Os. - Bendik Kleveland; Michael John Miller; Ronald B. David; Jay Patel 003; Rajesh Chopra; Dipak K. Sikdar; Jeff Kumala; Socrates D. Vamvakos; Mike Morrison; Ming Liu; Jayaprakash Balachandran (IEEE Micro, 2013)

Early detection and repair of VRT and aging DRAM bits by margined in-field BIST. - Bendik Kleveland; Jeong Choi; Jeff Kumala; Pascal Adam; Patrick Chen; Rajesh Chopra; Antonio Cruz; Ronald B. David; Ashish Dixit; Sinan Doluca; Mark Hendrickson; Ben Lee; et al. (VLSIC, 2014)