IEEE P1687: Toward Standardized Access of Embedded Instrumentation. - Ken Posse; Al Crouch; Jeff Rearick; Bill Eklow; Mike Laisne; Ben Bennetts; Jason Doege; Mike Ricchetti; Jean-Francois Cote (ITC, 2006)

Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture. - Rajsekhar Adapa; Edward Flanigan; Spyros Tragoudas; Michael Laisne; Hailong Cui; Tsvetomir Petrov (ISQED, 2007)

Verification and debugging of IDDQ test of low power chips. - Michael Laisne; Triphuong Nguyen; Songlin Zuo; Xiangdong Pan; Hailong Cui; Cher Bai; A. Street; M. Parley; Neetu Agrawal; K. Sundararaman (ITC, 2007)

Function-based ATPG for Path Delay Faults using the Launch-Off-Capture Scan Architecture. - Edward Flanigan; Rajsekhar Adapa; Hailong Cui; Michael Laisne; Spyros Tragoudas; Tsvetomir Petrov (VLSI Design, 2007)

Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study. - Dragoljub Gagi Drmanac; Michael Laisne (ITC, 2011)

Advanced methods for leveraging new test standards. - Mike Laisne (VTS, 2011)

Single-pin test control for Big A, little D devices. - Michael Laisne; Hans Martin von Staudt; Sourabh Bhalerao; Mark Eason (ITC, 2017)

Generalizing Access to Instrumentation Embedded in a Semiconductor Device. - Al Crouch; Michael Laisne; Martin Keim (Computer, 2017)

Modeling Novel Non-JTAG IEEE 1687-Like Architectures. - Mike Laisne; Alfred L. Crouch; Michele Portolan; Martin Keim; Hans Martin von Staudt; M. Abdalwahab; Bradford G. Van Treuren; Jeff Rearick (ITC, 2020)

Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices. - Hans Martin von Staudt; Mohamed Anas Benhebibi; Jeff Rearick; Michael Laisne (ITC, 2020)

IEEE P1687.1: Extending the Network Boundaries for Test. - Michael Laisne; Alfred L. Crouch; Michele Portolan; Martin Keim; Hans Martin von Staudt; Bradford G. Van Treuren; Jeff Rearick; Songlin Zuo (ITC, 2022)