Variations of fault manifestation during Burn-In - A case study on industrial SRAM test results. - Michael Linder; Alfred Eder; Klaus Oberländer; Martin Huch (IOLTS, 2011)

Mitigating power- and timing-based side-channel attacks using dual-spacer dual-rail delay-insensitive asynchronous logic. - Washington Cilio; Michael Linder; Chris Porter; Jia Di; Dale R. Thompson; Scott C. Smith (Microelectron. J., 2013)

Test Set Optimization for Industrial SRAM Testing. - Michael Linder (2013)

An Analysis of Industrial SRAM Test Results - A Comprehensive Study on Effectiveness and Classification of March Test Algorithms. - Michael Linder; Alfred Eder; Ulf Schlichtmann; Klaus Oberländer (IEEE Des. Test, 2014)