A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. - Michael Mateja; Alfred L. Crouch; Renny Eisele; Grady Giles; Dale Amason (ITC, 1997)

Test Development for Second-Generation ColdFire Microprocessors. - Dale Amason; Alfred L. Crouch; Renny Eisele; Grady Giles; Michael Mateja (IEEE Des. Test Comput., 1998)

The testability features of the 3rd generation ColdFire family of microprocessors. - Alfred L. Crouch; Michael Mateja; Teresa L. McLaurin; John C. Potter; Dat Tran (ITC, 1999)

Test Development for a Third-Version ColdFire Microprocessor. - Alfred L. Crouch; Michael Mateja; Teresa L. McLaurin; John C. Potter; Dat Tran (IEEE Des. Test Comput., 2000)

The Test Features of the Quad-Core AMD Opteron- Microprocessor. - Tim Wood 001; Grady Giles; Chris Kiszely; Martin Schuessler; Daniela Toneva; Joel Irby; Michael Mateja (ITC, 2008)

Data learning techniques and methodology for Fmax prediction. - Janine Chen; Li-C. Wang; Po-Hsien Chang; Jing Zeng; S. Yu; Michael Mateja (ITC, 2009)

A Path-Oriented Timing-Aware Diagnosis Methodology of At-Speed Transition Tests. - Jing Zeng; Jing Wang; Michael Mateja (MTV, 2009)

Correlating system test Fmax with structural test Fmax and process monitoring measurements. - Janine Chen; Jing Zeng; Li-C. Wang; Michael Mateja (ASP-DAC, 2010)

Scan based speed-path debug for a microprocessor. - Jing Zeng; Ruifeng Guo; Wu-Tung Cheng; Michael Mateja; Jing Wang; Kun-Han Tsai; Ken Amstutz (ETS, 2010)

On evaluating speed path detection of structural tests. - Jing Zeng; Jing Wang; Chia-Ying Chen; Michael Mateja; Li-C. Wang (ISQED, 2010)

Mining AC delay measurements for understanding speed-limiting paths. - Janine Chen; Brendon Bolin; Li-C. Wang; Jing Zeng; Dragoljub Gagi Drmanac; Michael Mateja (ITC, 2010)

Selecting the most relevant structural Fmax for system Fmax correlation. - Janine Chen; Jing Zeng; Li-C. Wang; Jeff Rearick; Michael Mateja (VTS, 2010)

Scan-Based Speed-Path Debug for a Microprocessor. - Jing Zeng; Ruifeng Guo; Wu-Tung Cheng; Michael Mateja; Jing Wang (IEEE Des. Test Comput., 2012)