Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. - Charles S. Whitman; Michael Meeder (Microelectron. Reliab., 2005)

Application of Machine Model ESD tester to high volume capacitor reliability testing. - Michael Meeder; Leslie Marchut; Michael J. Antonell; Michael T. Fresina; Christopher E. Novak; Terry C. Darche (Microelectron. Reliab., 2011)

Process reliability screening in situ. - Leslie Marchut; Michael G. Meeder; Terrence Stark (Microelectron. Reliab., 2014)

Determination of safe reliability region over temperature and current density for through wafer vias. - Charles S. Whitman; Michael G. Meeder; Peter J. Zampardi (Microelectron. Reliab., 2017)