A unified built-in-test scheme: UBIST. - Michael Nicolaidis (FTCS, 1988)

UBIST version of the SYCO's control section compiler. - Kholdoun Torki; Michael Nicolaidis; Ahmed Amine Jerraya; Bernard Courtois (ICCD, 1988)

Strongly Code Disjoint Checkers. - Michael Nicolaidis; Bernard Courtois (IEEE Trans. Computers, 1988)

A generalized theory of fail-safe systems. - Michael Nicolaidis; Serge Noraz; Bernard Courtois (FTCS, 1989)

Self-checking logic arrays. - Michael Nicolaidis; Bernard Courtois (Microprocess. Microsystems, 1989)

Self-exercising checkers for unified built-in self-test (UBIST). - Michael Nicolaidis (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989)

A self-checking PLA automatic generator tool based on unordered codes encoding. - Kholdoun Torki; Michael Nicolaidis; Antônio Otávio Fernandes (EURO-DAC, 1991)

Built-In Self-Test for Multi-Port RAMs. - Vladimir Castro Alves; Michael Nicolaidis; P. Lestrat; Bernard Courtois (ICCAD, 1991)

New Implementations, Tools, and Experiments for Decreasing Self-Checking PLAs Area Overhead. - Michael Nicolaidis; M. Boudjit (ICCD, 1991)

Shorts in self-checking circuits. - Michael Nicolaidis (J. Electron. Test., 1991)

Silicon compilation of hierarchical control sections with unified BIST testability. - Michael Nicolaidis; Kholdoun Torki; Ahmed Amine Jerraya; Bernard Courtois (Microprocess. Microsystems, 1991)

Design of Static CMOS Self-Checking Circuits using Built-In Current Sensing. - Jien-Chung Lo; James C. Daly; Michael Nicolaidis (FTCS, 1992)

A Tool for Automatic Generation of BISTed and Transparent BISTed Rams. - O. Kebichi; Michael Nicolaidis (ICCD, 1992)

Transparent BIST for RAMs. - Michael Nicolaidis (ITC, 1992)

Improving the theory of truth table verification of iterative logic arrays. - Michael Nicolaidis (VTS, 1992)

An SFS Berger check prediction ALU and its application to self-checking processor designs. - Jien-Chung Lo; Suchai Thanawastien; T. R. N. Rao; Michael Nicolaidis (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

Efficient Implementations of Self-Checking Adders and ALUs. - Michael Nicolaidis (FTCS, 1993)

Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. - F. L. Vargas; Michael Nicolaidis; Bernard Courtois (ICCD, 1993)

Finitely self-checking circuits and their application on current sensors. - Michael Nicolaidis (VTS, 1993)

Quiescent current estimation based on quality requirements. - Fabian Luis Vargas 001; Michael Nicolaidis; B. Hamdi (VTS, 1993)

Efficient Implementations of Self-Checking Multiply and Divide Arrays. - Michael Nicolaidis; Hakim Bederr (EDAC-ETC-EUROASIC, 1994)

A Test Methodology Applied to Cellular Logic Programmable Gate Arrays. - Ricardo de Oliveira Duarte; Michael Nicolaidis (FPL, 1994)

SEU-Tolerant SRAM Design Based on Current Monitoring. - F. L. Vargas; Michael Nicolaidis (FTCS, 1994)

Aliasing-free Signature Analysis for RAM BIST. - Vyacheslav N. Yarmolik; Michael Nicolaidis; O. Kebichi (ITC, 1994)

Design for testability of on-line multipliers. - Hakim Bederr; Michael Nicolaidis; Alain Guyot (VTS, 1994)

Efficient UBIST for RAMs. - Michael Nicolaidis (VTS, 1994)

Zero aliasing ROM BIST. - O. Kebichi; Vyacheslav N. Yarmolik; Michael Nicolaidis (J. Electron. Test., 1994)

Trade-offs in scan path and BIST implementations for RAMs. - Michael Nicolaidis; O. Kebichi; Vladimir Castro Alves (J. Electron. Test., 1994)

Fault secure property versus strongly code disjoint checkers. - Michael Nicolaidis (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

Analytic approach for error masking elimination in on-line multipliers. - Hakim Bederr; Michael Nicolaidis; Alain Guyot (IEEE Symposium on Computer Arithmetic, 1995)

Area versus detection latency trade-offs in self-checking memory design. - O. Kebichi; Yervant Zorian; Michael Nicolaidis (ED&TC, 1995)

Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments. - Th. Calin; F. L. Vargas; Michael Nicolaidis (ITC, 1995)

Exact Aliasing Computation for RAM BIST. - O. Kebichi; Michael Nicolaidis; Vyacheslav N. Yarmolik (ITC, 1995)

An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring. - Fabian Vargas 001; Michael Nicolaidis; Yervant Zorian (ITC, 1995)

A tool for automatic generation of self-checking data paths. - B. Hamdi; Hakim Bederr; Michael Nicolaidis (VTS, 1995)

Efficient UBIST implementation for microprocessor sequencing parts. - Michael Nicolaidis (J. Electron. Test., 1995)

A strongly code disjoint built-in current sensor for strongly fault-secure static CMOS realizations. - Jien-Chung Lo; James C. Daly; Michael Nicolaidis (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

Testing complex couplings in multiport memories. - Michael Nicolaidis; Vladimir Castro Alves; Hakim Bederr (IEEE Trans. Very Large Scale Integr. Syst., 1995)

E-Groups: A New Technique for Fast Backward Propagation in System Level Test Generation. - Michael Nicolaidis; Rubin A. Parekhji; M. Boudjit (Asian Test Symposium, 1996)

Achieving Fault Secureness in Parity Prediction Arithmetic Operators: General Conditions and Implementations. - Michael Nicolaidis; Salvador Manich; Joan Figueras (ED&TC, 1996)

Can Defect-Tolerant Chips Better Meet the Quality Challenge? - R. L. Campbell; P. Kuekes; David Y. Lepejian; Wojciech P. Maly; Michael Nicolaidis; Alex Orailoglu (VTS, 1996)

Enhancing realistic fault secureness in parity prediction array arithmetic operators by IDDQ monitoring. - Salvador Manich; Michael Nicolaidis; Joan Figueras (VTS, 1996)

Theory of Transparent BIST for RAMs. - Michael Nicolaidis (IEEE Trans. Computers, 1996)

Fault-secure shifter design: results and implementations. - Ricardo de Oliveira Duarte; Michael Nicolaidis; Hakim Bederr; Yervant Zorian (ED&TC, 1997)

On-Line Testing for VLSI. - Michael Nicolaidis (ITC, 1997)

Fault-Secure Parity Prediction Arithmetic Operators. - Michael Nicolaidis; Ricardo de Oliveira Duarte; Salvador Manich; Joan Figueras (IEEE Des. Test Comput., 1997)

An Approach to the On-Line Testing of Operational Amplifiers. - Jaime Velasco-Medina; Marcelo Lubaszewski; Michael Nicolaidis (Asian Test Symposium, 1998)

Design of Fault-Secure Parity-Prediction Booth Multipliers. - Michael Nicolaidis; Ricardo de Oliveira Duarte (DATE, 1998)

Fault Detection for Linear Analog Circuits Using Current Injection. - Jaime Velasco-Medina; Th. Calin; Michael Nicolaidis (DATE, 1998)

Current-based testing for analog and mixed-signal circuits. - Jaime Velasco-Medina; Michael Nicolaidis (ICCD, 1998)

Scaling Deeper to Submicron: On-Line Testing to the Rescue. - Michael Nicolaidis (ITC, 1998)

Design for soft-error robustness to rescue deep submicron scaling. - Michael Nicolaidis (ITC, 1998)

Guest Editors' Introduction: Online VLSI Testing. - Ramesh Karri; Michael Nicolaidis (IEEE Des. Test Comput., 1998)

Efficient Totally Self-Checking Shifter Design. - Ricardo de Oliveira Duarte; Michael Nicolaidis; Hakim Bederr; Yervant Zorian (J. Electron. Test., 1998)

On-Line Testing for VLSI - A Compendium of Approaches. - Michael Nicolaidis; Yervant Zorian (J. Electron. Test., 1998)

On-line testing for VLSI: state of the art and trends. - Michael Nicolaidis (Integr., 1998)

Fail-Safe Interfaces for VLSI: Theoretical Foundations and Implementation. - Michael Nicolaidis (IEEE Trans. Computers, 1998)

Scaling Deeper to Submicron: On-Line Testing to the Rescue. - Michael Nicolaidis; Yervant Zorian (DATE, 1999)

A CAD Framework for Generating Self-Checking 1 Multipliers Based on Residue Codes. - Issam Alzaher-Noufal; Michael Nicolaidis (DATE, 1999)

A One-Bit-Signature BIST for Embedded Operational Amplifiers in Mixed-Signal Circuits Based on the Slew-Rate Detection. - Iyad Rayane; Jaime Velasco-Medina; Michael Nicolaidis (DATE, 1999)

On Path Delay Fault Testing of Multiplexer - Based Shifters. - Haridimos T. Vergos; Dimitris Nikolos; Y. Tsiatouhas; Th. Haniotakis; Michael Nicolaidis (Great Lakes Symposium on VLSI, 1999)

On-Line BIST for Testing Analog Circuits. - Jaime Velasco-Medina; Iyad Rayane; Michael Nicolaidis (ICCD, 1999)

A New Placement Algorithm Dedicated to Parallel Computers: Bases and Application. - Fabien Clermidy; Thierry Collette; Michael Nicolaidis (PRDC, 1999)

Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. - Th. Calin; Lorena Anghel; Michael Nicolaidis (VTS, 1999)

Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies. - Michael Nicolaidis (VTS, 1999)

A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits. - Iyad Rayane; Jaime Velasco-Medina; Michael Nicolaidis (VTS, 1999)

Fault-Secure Parity Prediction Booth Multipliers. - Michael Nicolaidis; Ricardo de Oliveira Duarte (IEEE Des. Test Comput., 1999)

Guest Editorial. - Michael Nicolaidis; Rob Roy (J. Electron. Test., 1999)

Cost Reduction and Evaluation of a Temporary Faults Detecting Technique. - Lorena Anghel; Michael Nicolaidis (DATE, 2000)

Tutorial Statement. - Yervant Zorian; Michael Nicolaidis; Peter Muhmenthaler; David Y. Lepejian; Chris W. H. Strolenberg; Kees Veelenturf (DATE, 2000)

ISIS: A Fail-Safe Interface Realized in Smart Power Technology. - Michael Nicolaidis; N. Zaidan; Th. Calin; D. Bied-Charreton (IOLTW, 2000)

Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy. - Lorena Anghel; Dan Alexandrescu; Michael Nicolaidis (SBCCI, 2000)

Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. - Lorena Anghel; Michael Nicolaidis; Issam Alzaher-Noufal (VTS, 2000)

Fail-Safe Synchronization Circuit for Duplicated Systems. - Eleftherios Kolonis; Michael Nicolaidis (DFT, 2001)

Designing and Implementing Efficient BISR Techniques for Embedded RAMs. - Michael Nicolaidis; Slimane Boutobza; Nadir Achouri; R. D. Shawn Blanton; Julie Segal; David Y. Lepejian; Ben Chu; Tony Singh; Harvey Berman (LATW, 2001)

Soft Errors and Tolerance for Soft Errors. - Jim Chung; N. Derhacobian; Jean Gasiot; Michael Nicolaidis; David Towne; Raoul Velazco (VTS, 2001)

Embedded Robustness Ips. - Eric Dupont; Michael Nicolaidis; Peter Rohr (DATE, 2002)

IP for Embedded Robustness. - Michael Nicolaidis (DATE, 2002)

New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs. - Dan Alexandrescu; Lorena Anghel; Michael Nicolaidis (DFT, 2002)

Robustness IPs for Reliability and Security of SoCs. - Eric Dupont; Michael Nicolaidis (ITC, 2002)

Soft Error Protection for Embedded Memories. - Michael Nicolaidis (MTDT, 2002)

Embedded Robustness IPs for Transient-Error-Free ICs. - Eric Dupont; Michael Nicolaidis; Peter Rohr (IEEE Des. Test Comput., 2002)

Guest Editorial. - Dimitris Nikolos; John P. Hayes; Michael Nicolaidis; Cecilia Metra (J. Electron. Test., 2002)

Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair. - Michael Nicolaidis; Nadir Achouri; Slimane Boutobza (DATE, 2003)

A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities. - Michael Nicolaidis; Nadir Achouri; Lorena Anghel (DFT, 2003)

Dynamic Data-bit Memory Built-In Self- Repair. - Michael Nicolaidis; Nadir Achouri; Slimane Boutobza (ICCAD, 2003)

Memory Built-In Self-Repair for Nanotechnologies. - Michael Nicolaidis; Nadir Achouri; Lorena Anghel (IOLTS, 2003)

Reliability Threats in VDSM - Shortcomings in Conventional Test and Fault-Tolerance Alternatives. - Michael Nicolaidis (ITC, 2003)

Carry checking/parity prediction adders and ALUs. - Michael Nicolaidis (IEEE Trans. Very Large Scale Integr. Syst., 2003)

Evaluation of Memory Built-in Self Repair Techniques for High Defect Density Technologie. - Lorena Anghel; Nadir Achouri; Michael Nicolaidis (PRDC, 2004)

A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies. - Michael Nicolaidis; Nadir Achouri; Lorena Anghel (VTS, 2004)

Simulating Single Event Transients in VDSM ICs for Ground Level Radiation. - Dan Alexandrescu; Lorena Anghel; Michael Nicolaidis (J. Electron. Test., 2004)

An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories. - Balkaran S. Gill; Michael Nicolaidis; Francis G. Wolff; Christos A. Papachristou; Steven L. Garverick (DATE, 2005)

Simulation and Mitigation of Single Event Effects. - Lorena Anghel; Michael Nicolaidis (IOLTS, 2005)

Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM. - Balkaran S. Gill; Michael Nicolaidis; Christos A. Papachristou (IOLTS, 2005)

Design for Mitigation of Single Event Effects. - Michael Nicolaidis (IOLTS, 2005)

Programmable memory BIST. - Slimane Boutobza; Michael Nicolaidis; Kheiredine M. Lamara; Andrea Costa (ITC, 2005)

Memory Defect Tolerance Architectures for Nanotechnologies. - Michael Nicolaidis; Lorena Anghel; Nadir Achouri (J. Electron. Test., 2005)

A Transparent based Programmable Memory BIST. - Slimane Boutobza; Michael Nicolaidis; Kheiredine M. Lamara; Andrea Costa (ETS, 2006)

From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? - Lorena Anghel; Michael Nicolaidis; Nadine Buard (IOLTS, 2006)

A Low-Cost Single-Event Latchup Mitigation Sscheme. - Michael Nicolaidis (IOLTS, 2006)

Multiple Defect Tolerant Devices for Unreliable Future Nanotechnologies. - Lorena Anghel; Cristiano Lazzari; Michael Nicolaidis (LATW, 2006)

Session Abstract. - Michael Nicolaidis (VTS, 2006)

Workshop on Dependable and Secure Nanocomputing. - Jean Arlat; Ravishankar K. Iyer; Michael Nicolaidis (DSN, 2007)

GRAAL: A Fault-Tolerant Architecture for Enabling Nanometric Technologies. - Michael Nicolaidis (IOLTS, 2007)

GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies. - Michael Nicolaidis (ITC, 2007)

Defects Tolerant Logic Gates for Unreliable Future Nanotechnologies. - Lorena Anghel; Michael Nicolaidis (IWANN, 2007)

Second workshop on dependable and secure nanocomputing. - Jean Arlat; Cristian Constantinescu; Ravishankar K. Iyer; Michael Nicolaidis (DSN, 2008)

Special Session 2: Benchmarking and Standardization in Software-Based SER Characterization: Towards an IEEE Task Force? - Michael Nicolaidis (IOLTS, 2008)

Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors. - Michael Nicolaidis; Renaud Perez; Dan Alexandrescu (VTS, 2008)

Towards a holistic CAD platform for nanotechnologies. - Eleftherios Kolonis; Michael Nicolaidis (Microelectron. J., 2008)

Third workshop on dependable and secure nanocomputing. - Jean Arlat; Cristian Constantinescu; Ravishankar K. Iyer; Johan Karlsson; Michael Nicolaidis (DSN, 2009)

Variability and reliability-aware application tasks scheduling and power control (Voltage and Frequency Scaling) in the future nanoscale multiprocessors system on chip. - Gilles Bizot; Nacer-Eddine Zergainoh; Michael Nicolaidis (IOLTS, 2009)

Enhanced self-configurability and yield in multicore grids. - Eleftherios Kolonis; Michael Nicolaidis; Dimitris Gizopoulos; Mihalis Psarakis; Jacques Henri Collet; Piotr Zajac (IOLTS, 2009)

An effective approach to detect logic soft errors in digital circuits based on GRAAL. - Hai Yu; Michael Nicolaidis; Lorena Anghel (ISQED, 2009)

Fourth workshop on dependable and secure nanocomputing. - Jean Arlat; Cristian Constantinescu; Ravishankar K. Iyer; Johan Karlsson; Michael Nicolaidis (DSN, 2010)

Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems. - Michael Nicolaidis; Vladimir Pasca; Lorena Anghel (IOLTS, 2010)

Fault-Tolerant Deadlock-Free Adaptive Routing for Any Set of Link and Node Failures in Multi-cores Systems. - Fabien Chaix; Dimiter Avresky; Nacer-Eddine Zergainoh; Michael Nicolaidis (NCA, 2010)

A fault-tolerant deadlock-free adaptive routing for on chip interconnects. - Fabien Chaix; Dimiter Avresky; Nacer-Eddine Zergainoh; Michael Nicolaidis (DATE, 2011)

Eliminating speed penalty in ECC protected memories. - Michael Nicolaidis; Thierry Bonnoit; Nacer-Eddine Zergainoh (DATE, 2011)

A Practical Approach to Single Event Transients Analysis for Highly Complex Designs. - Dan Alexandrescu; Enrico Costenaro; Michael Nicolaidis (DFT, 2011)

I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems. - Michael Nicolaidis; Vladimir Pasca; Lorena Anghel (ETS, 2011)

Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor. - Hai Yu; Michael Nicolaidis; Lorena Anghel; Nacer-Eddine Zergainoh (ETS, 2011)

Towards a tool for implementing delay-free ECC in embedded memories. - Thierry Bonnoit; Michael Nicolaidis; Nacer-Eddine Zergainoh (ICCD, 2011)

Variability-aware task mapping strategies for many-cores processor chips. - Fabien Chaix; Gilles Bizot; Michael Nicolaidis; Nacer-Eddine Zergainoh (IOLTS, 2011)

Memory BIST with address programmability. - Aymen Fradi; Michael Nicolaidis; Lorena Anghel (IOLTS, 2011)

Self-Recovering Parallel Applications in Multi-core Systems. - Gilles Bizot; Dimiter Avresky; Fabien Chaix; Nacer-Eddine Zergainoh; Michael Nicolaidis (NCA, 2011)

Design for test and reliability in ultimate CMOS. - Michael Nicolaidis; Lorena Anghel; Nacer-Eddine Zergainoh; Yervant Zorian; Tanay Karnik; Keith A. Bowman; James W. Tschanz; Shih-Lien Lu; Carlos Tokunaga; Arijit Raychowdhury; Muhammad M. Khellah; Jaydeep Kulkarni; et al. (DATE, 2012)

RIIF - Reliability information interchange format. - Adrian Evans; Michael Nicolaidis; Shi-Jie Wen; Dan Alexandrescu; Enrico Costenaro (IOLTS, 2012)

Through-silicon-via built-in self-repair for aggressive 3D integration. - Michael Nicolaidis; Vladimir Pasca; Lorena Anghel (IOLTS, 2012)

Test algorithms for ECC-based memory repair in nanotechnologies. - Panagiota Papavramidou; Michael Nicolaidis (VTS, 2012)

Biologically Inspired Robust Tera-Device Processors. - Michael Nicolaidis (IEEE Des. Test, 2012)

CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems. - Vladimir Pasca; Lorena Anghel; Michael Nicolaidis; Mounir Benabdenbi (J. Electron. Test., 2012)

Reliability challenges of real-time systems in forthcoming technology nodes. - Said Hamdioui; Michael Nicolaidis; Dimitris Gizopoulos; Arnaud Grasset; Guido Groeseneken; Philippe Bonnot 001 (DATE, 2013)

Variability-aware and fault-tolerant self-adaptive applications for many-core chips. - Gilles Bizot; Fabien Chaix; Nacer-Eddine Zergainoh; Michael Nicolaidis (ETS, 2013)

Reducing power dissipation in memory repair for high defect densities. - Panagiota Papavramidou; Michael Nicolaidis (ETS, 2013)

Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip. - Michael G. Dimopoulos; Yi Gang; Mounir Benabdenbi; Lorena Anghel; Nacer-Eddine Zergainoh; Michael Nicolaidis (IOLTS, 2013)

Transparent BIST for ECC-based memory repair. - Michael Nicolaidis; Panagiota Papavramidou (IOLTS, 2013)

Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops. - Adrian Evans; Michael Nicolaidis; Shi-Jie Wen; Thiago Asis (ISQED, 2013)

Hot topic session 4A: Reliability analysis of complex digital systems. - Adrian Evans; Michael Nicolaidis; Rob Aitken; Burcin Aktan; Olivier Lauzeral (VTS, 2013)

An iterative diagnosis approach for ECC-based memory repair. - Panagiota Papavramidou; Michael Nicolaidis (VTS, 2013)

Using Error Correcting Codes Without Speed Penalty in Embedded Memories: Algorithm, Implementation and Case Study. - Thierry Bonnoit; Michael Nicolaidis; Nacer-Eddine Zergainoh (J. Electron. Test., 2013)

A Practical Approach to Single Event Transient Analysis for Highly Complex Design. - Enrico Costenaro; Dan Alexandrescu; Kader Belhaddad; Michael Nicolaidis (J. Electron. Test., 2013)

A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis. - Fabien Chaix; Nacer-Eddine Zergainoh; Michael Nicolaidis (ETS, 2014)

Congestion-Aware Adaptive Routing in 2D-Mesh Multicores. - Dimiter Avresky; Fabien Chaix; Michael Nicolaidis (NCA, 2014)

Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip. - Michael G. Dimopoulos; Yi Gang; Lorena Anghel; Mounir Benabdenbi; Nacer-Eddine Zergainoh; Michael Nicolaidis (Microprocess. Microsystems, 2014)

MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip. - Amir Charif; Nacer-Eddine Zergainoh; Michael Nicolaidis (IOLTS, 2015)

Low-power memory repair for high defect densities. - Panagiota Papavramidou; Michael Nicolaidis (IOLTS, 2015)

Memory repair for high defect densities. - Michael Nicolaidis; Panagiota Papavramidou (VTS, 2015)

A new approach to deadlock-free fully adaptive routing for high-performance fault-tolerant NoCs. - Amir Charif; Nacer-Eddine Zergainoh; Michael Nicolaidis (DFT, 2016)

Addressing transient routing errors in fault-tolerant Networks-on-Chips. - Amir Charif; Nacer-Eddine Zergainoh; Michael Nicolaidis (ETS, 2016)

Advanced double-sampling architectures. - Michael Nicolaidis; Michael G. Dimopoulos (IOLTS, 2016)

Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS. - Panagiota Papavramidou; Michael Nicolaidis (IEEE Trans. Computers, 2016)

Detailed and highly parallelizable cycle-accurate network-on-chip simulation on GPGPU. - Amir Charif; Alexandre Coelho; Nacer-Eddine Zergainoh; Michael Nicolaidis (ASP-DAC, 2017)

Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs. - Amir Charif; Nacer-Eddine Zergainoh; Alexandre Coelho; Michael Nicolaidis (ETS, 2017)

Low cost rollback to improve fault-tolerance in VLSI circuits. - Thierry Bonnoit; Nacer-Eddine Zergainoh; Michael Nicolaidis; Raoul Velazco (LASCAS, 2017)

MINI-ESPADA: A low-cost fully adaptive routing mechanism for Networks-on-Chips. - Amir Charif; Alexandre Coelho; Nacer-Eddine Zergainoh; Michael Nicolaidis (LATS, 2017)

A Framework for Scalable TSV Assignment and Selection in Three-Dimensional Networks-on-Chips. - Amir Charif; Alexandre Coelho; Nacer-Eddine Zergainoh; Michael Nicolaidis (VLSI Design, 2017)

Designing reliable processor cores in ultimate CMOS and beyond: A double sampling solution. - Thierry Bonnoit; Fraidy Bouesse; Nacer-Eddine Zergainoh; Michael Nicolaidis (DATE, 2018)

Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance. - Thierry Bonnoit; Nacer-Eddine Zergainoh; Michael Nicolaidis (IEEE Trans. Very Large Scale Integr. Syst., 2018)

An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM. - Panagiota Papavramidou; Michael Nicolaidis; Patrick Girard 001 (IOLTS, 2020)

Iterative Diagnosis Approach for ECC-Based Memory Repair. - Panagiota Papavramidou; Michael Nicolaidis (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

A Dynamic Sufficient Condition of Deadlock-Freedom for High-Performance Fault-Tolerant Routing in Networks-on-Chips. - Amir Charif; Alexandre Coelho; Nacer-Eddine Zergainoh; Michael Nicolaidis (IEEE Trans. Emerg. Top. Comput., 2020)

The Quest of the Ideal Error Detecting Architecture: The GRAAL Architecture. - Michael G. Dimopoulos; Michael Nicolaidis (IEEE Trans. Sustain. Comput., 2021)

Reducing Power Dissipation in Memory Repair for High Fault Rates. - Panagiota Papavramidou; Michael Nicolaidis (IEEE Trans. Very Large Scale Integr. Syst., 2023)