A low power 4-GHz DCO with fine resolution and wide tuning range in 22 nm FDSOI CMOS technology. - Chi Zhang; Michael Otto 003 (RWS, 2017)

RTN and LFN Noise Performance in Advanced FDSOI Technology. - Luca Pirro; Olaf Zimmerhackl; Alban Zaka; Lars Müller-Meskamp; Ranjith Nelluri; Tom Hermann; Ignasi Cortes-Mayol; Andreas Huschka; Michael Otto 003; E. Nowak; Anurag Mittal; Jan Hoentschel (ESSDERC, 2018)

Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments. - Jens Warmuth; Kay-Uwe Giering; André Lange; André Clausner; Simon Schlipf; Gottfried Kurz; Michael Otto 003; Jens Paul; Roland Jancke; Andreas Aal; Martin Gall; Ehrenfried Zschech (ESSDERC, 2018)

Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation. - André Clausner; Simon Schlipf; Gottfried Kurz; Michael Otto 003; Jens Paul; Kay-Uwe Giering; Jens Warmuth; André Lange; Roland Jancke; Andreas Aal; Rüdiger Rosenkranz; Martin Gall; et al. (IRPS, 2018)

Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias. - Luca Pirro; Alban Zaka; Olaf Zimmerhackl; T. Hermann; Michael Otto 003; E. M. Bazizi; Jan Hoentschel; X. Li; R. Taylor (IRPS, 2019)

Novel embedded single poly floating gate flash demonstrated in 22nm FDSOI technology. - Thomas Melde; Martin Trentzsch; Stefan Dünkel; Ralf Richter; Michael Otto 003; H. Giesler; Francois Weisbuch; N. Weddeler; Sven Beyer (IMW, 2021)

Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices. - Luca Pirro; Aarthi Jayakumar; Olaf Zimmerhackl; Dieter Lipp; Ralf Illgen; Armin Muehlhoff; Ronny Pfuetzner; Alban Zaka; Michael Otto 003; Jan Hoentschel; Yannick Raffel; Konrad Seidel; et al. (IRPS, 2021)

Experimental fabrication of an ESF3 floating gate flash cell in an FD-SOI process. - Nicki Mika; Thomas Melde; Stefan Dünkel; Michael Otto 003; Francois Weisbuch; Peter Krottenthaler; Thomas Mikolajick (ESSDERC, 2022)

Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. - Luca Pirro; P. Liebscher; C. Brantz; M. Kessler; H. Herzog; Olaf Zimmerhackl; R. Jain; E. Ebrand; K. Gebauer; Michael Otto 003; Alban Zaka; Jan Hoentschel (IRPS, 2022)