Embedded DRAM built in self test and methodology for test insertion. - Peter Jakobsen; Jeffrey H. Dreibelbis; Gary Pomichter; Darren Anand; John Barth 001; Michael R. Nelms; Jeffrey Leach; George M. Belansek (ITC, 2001)

Embedded DRAM design and architecture for the IBM 0.11-µm ASIC offering. - John E. Barth Jr.; Jeffrey H. Dreibelbis; Eric A. Nelson; Darren Anand; Gary Pomichter; Peter Jakobsen; Michael R. Nelms; Jeffrey Leach; George M. Belansek (IBM J. Res. Dev., 2002)

Generating At-Speed Array Fail Maps with Low-Speed ATE. - Michael R. Nelms; Kevin W. Gorman; Darren Anand (VTS, 2004)

A 500-MHz multi-banked compilable DRAM macro with direct write and programmable pipelining. - John E. Barth Jr.; Darren Anand; Steve Burns 001; Jeffrey H. Dreibelbis; John A. Fifield; Kevin W. Gorman; Michael R. Nelms; Erik Nelson; Adrian Paparelli; Gary Pomichter; Dale E. Pontius; Stephen Sliva (IEEE J. Solid State Circuits, 2005)