Shared fuse macro for multiple embedded memory devices with redundancy. - Michael R. Ouellette; Darren Anand; Peter Jakobsen (CICC, 2001)

Optimizing delay tests at the memory boundary. - Kelly A. Ockunzzi; Michael R. Ouellette; Kevin W. Gorman (ITC, 2015)

Practical Application of RAM Sequential Test. - Kelly A. Ockunzzi; Michael R. Ouellette; Kevin W. Gorman (IEEE Des. Test, 2016)