Fault Models and Tests for a 2-Bit-per-Cell MLDRAM. - Michael Redeker; Bruce F. Cockburn; Duncan G. Elliott (IEEE Des. Test Comput., 1999)

A Multifunctional Laser Linking and Cutting Structure for Standard 0.25 mum CMOS-Technology. - Ole Mende; Michael Redeker; Markus Rudack; Dieter Treytnar (DFT, 2000)

Self-Configuration of a Large Area Integrated Multiprocessor System for Video Applications. - Markus Rudack; Michael Redeker; Dieter Treytnar; Ole Mende; Klaus Herrmann 002 (DFT, 2000)

Diagnostic Testing of Embedded Memories Based on Output Tracing. - Dirk Niggemeyer; Elizabeth M. Rudnick; Michael Redeker (MTDT, 2000)

Using GLFSRs for Pseudo-Random Memory BIST. - Michael Redeker; Markus Rudack; Thomas Lobbe; Dirk Niggemeyer (MTDT, 2000)

An Investigation into Crosstalk Noise in DRAM Structures. - Michael Redeker; Bruce F. Cockburn; Duncan G. Elliott (MTDT, 2002)

Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM. - Michael Redeker; Bruce F. Cockburn; Duncan G. Elliott; Yunan Xiang; Sue Ann Ung (MTDT, 2002)

A Large-Area Integrated Multiprocessor System for Video Applications. - Markus Rudack; Michael Redeker; Jörg Hilgenstock; Sören Moch; Jens Castagne (IEEE Des. Test Comput., 2002)