Cell-aware analysis for small-delay effects and production test results from different fault models. - Friedrich Hapke; Jürgen Schlöffel; Wilfried Redemund; Andreas Glowatz; Janusz Rajski; Michael Reese; J. Rearick; Jason Rivers (ITC, 2011)

Cell-aware Production test results from a 32-nm notebook processor. - Friedrich Hapke; Michael Reese; Jason Rivers; A. Over; V. Ravikumar; Wilfried Redemund; Andreas Glowatz; Jürgen Schlöffel; Janusz Rajski (ITC, 2012)

Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. - Huaxing Tang; Brady Benware; Michael Reese; Joseph Caroselli; Thomas Herrmann; Friedrich Hapke; Robert Tao; Wu-Tung Cheng; Manish Sharma (ATS, 2014)

Cell-Aware Test. - Friedrich Hapke; Wilfried Redemund; Andreas Glowatz; Janusz Rajski; Michael Reese; Marek Hustava; Martin Keim; Juergen Schloeffel; Anja Fast (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

Optical flow on degraded imagery. - Josh Harguess; Chris Barngrover; Michael Reese (AIPR, 2016)