All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage. - Michael Sekyere; Marampally Saikiran; Degang Chen 001 (IOLTS, 2022)

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview. - Marampally Saikiran; Michael Sekyere; Mona Ganji; Degang Chen 001 (EWDTS, 2023)

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency. - Marampally Saikiran; Michael Sekyere; Mona Ganji; Degang Chen 001 (EWDTS, 2023)

A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers. - Michael Sekyere; Marampally Saikiran; Degang Chen 001 (EWDTS, 2023)

Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm. - Isaac Bruce; Michael Sekyere; Emmanuel Nti Darko; Ekaniyere Oko-Odion; Kushagra Bhatheja; Degang Chen 001 (MWSCAS, 2023)

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm. - Michael Sekyere; Emmanuel Nti Darko; Isaac Bruce; Ekaniyere Oko-Odion; Kushagra Bhatheja; Degang Chen 001 (MWSCAS, 2023)

Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm. - Ekaniyere Oko-Odion; Isaac Bruce; Emmanuel Nti Darko; Michael Sekyere; Degang Chen 001 (ISVLSI, 2024)

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs. - Saeid Karimpour; Isaac Bruce; Michael Sekyere; Ruohan Yang; Emmanuel Nti Darko; Degang Chen 001 (MWSCAS, 2024)

Invited Paper: Low Power, Fully-Integrated Flipped Voltage Follower LDO Using Off-State Non-Linear Circuits for Enhanced Transient Performance. - Michael Sekyere; Degang Chen 001 (MWSCAS, 2024)

Digital Defect Oriented Test Method for Phase Locked Loops with High Coverage. - Michael Sekyere; Marampally Saikiran; Godfred Bonsu; Kelvin W. Tamakloe; Rob Butler; Reed Adams; Degang Chen 001 (I2MTC, 2025)

Signal Flow Graph Analysis of Analog Circuits using Principles of Control Theory : Tutorial Review. - Michael Sekyere; Marampally Saikiran; Degang Chen 001 (ISCAS, 2025)

Robust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry. - Michael Sekyere; Marampally Saikiran; Rob Butler; Reed Adams; Degang Chen 001 (ISCAS, 2025)

Matching Critical Analog Circuit Components Up To Third-Order Gradients for All Possible Exact Matching Ratios. - Michael Sekyere; Isaac Bruce; Ruohan Yang; Degang Chen 001; Colin C. McAndrew; Xiankun Jin; Chen He; Doug Garrity (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)