Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. - Xiaojun Li 001; Bing Huang; J. Qin; X. Zhang; Michael Talmor; Z. Gur; Joseph B. Bernstein (ISQED, 2005)

Electronic circuit reliability modeling. - Joseph B. Bernstein; Moshe Gurfinkel; Xiaojun Li 001; Jörg Walters; Yoram Shapira; Michael Talmor (Microelectron. Reliab., 2006)