Multi-cell soft errors at the 16-nm FinFET technology node. - N. Tam; Bharat L. Bhuva; Lloyd W. Massengill; Dennis R. Ball; Michael W. McCurdy; Michael L. Alles; Indranil Chatterjee (IRPS, 2015)

Effects of Charge Generation and Trapping on the X-ray Response of Strained AlGaN/GaN HEMTs. - Peng Wang; En-xia Zhang; Daniel M. Fleetwood; Peng Fei Wang; Michael W. McCurdy; Ji-Tzouh Lin; Michael L. Alles; Jim L. Davidson; Bruce W. Alphenaar; Ronald D. Schrimpf (ASICON, 2021)