Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices. - Nagarajan Raghavan; Michel Bosman; Daniel D. Frey; Kin Leong Pey (Microelectron. Reliab., 2014)

Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective. - Nagarajan Raghavan; Michel Bosman; Kin Leong Pey (Microelectron. Reliab., 2014)

Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO2 on reliability of SiOx interfacial layer. - Kalya Shubhakar; Nagarajan Raghavan; Sunil Singh Kushvaha; Michel Bosman; Zhongrui Wang; Sean J. O'Shea; Kin Leong Pey (Microelectron. Reliab., 2014)

Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer. - Nagarajan Raghavan; Michel Bosman; Kin Leong Pey (IRPS, 2015)

Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM. - Nagarajan Raghavan; Daniel D. Frey; Michel Bosman; Kin Leong Pey (IRPS, 2015)

Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory. - Nagarajan Raghavan; Michel Bosman; Kin Leong Pey (Microelectron. Reliab., 2015)

Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach. - Nagarajan Raghavan; Daniel D. Frey; Michel Bosman; Kin Leong Pey (Microelectron. Reliab., 2015)

An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO2/SiOx dielectric stacks for failure analysis. - Kalya Shubhakar; Michel Bosman; O. A. Neucheva; Y. C. Loke; Nagarajan Raghavan; R. Thamankar; Alok Ranjan 001; Sean J. O'Shea; Kin Leong Pey (Microelectron. Reliab., 2015)

Compliance current dominates evolution of NiSi2 defect size in Ni/dielectric/Si RRAM devices. - Sen Mei; Michel Bosman; Nagarajan Raghavan; Xing Wu 005; Kin Leong Pey (Microelectron. Reliab., 2016)

Conductive filament formation at grain boundary locations in polycrystalline HfO2 -based MIM stacks: Computational and physical insight. - Kalya Shubhakar; Sen Mei; Michel Bosman; Nagarajan Raghavan; Alok Ranjan 001; Sean J. O'Shea; Kin Leong Pey (Microelectron. Reliab., 2016)

Adding Interactivity to BalanSAR: a Spatial Augmented Reality Game for Balancing in Physical Education. - Danica Mast; Michel Bosman; Sylvia Schipper; Samantha Diederiks; Sanne de Vries (CHI PLAY (Companion), 2017)

BalanSAR: Using Spatial Augmented Reality to Train Children's Balancing Skills in Physical Education. - Danica Mast; Michel Bosman; Sylvia Schipper; Sanne de Vries (TEI, 2017)

Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. - Alok Ranjan 001; Nagarajan Raghavan; Sean J. O'Shea; Sen Mei; Michel Bosman; Kalya Shubhakar; Kin Leong Pey (IRPS, 2018)

Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films. - Alok Ranjan 001; Sean J. O'Shea; Michel Bosman; J. Molina; Nagarajan Raghavan; Kin Leong Pey (IRPS, 2020)