Analysis of similarities between alarm events in the semiconductor manufacturing process. - Mariam Melhem; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (MED, 2017)

Product quality prediction using alarm data : Application to the semiconductor manufacturing process. - Mariam Melhem; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (MED, 2017)

Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (CDC, 2019)

Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (CoDIT, 2019)

Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network*. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (ICSC, 2019)

Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (CDC, 2021)

From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry. - Mohammed Al-Kharaz; Bouchra Ananou; Mustapha Ouladsine; Michel Combal; Jacques Pinaton (ECC, 2021)