Developing a 0.18-micron CMOS process. - Michel Haond; Marie-Thérèse Basso; Walter deCoster; Jos Guelen; Christophe Lair (IEEE Micro, 1999)

Validated 90nm CMOS Technology Platform with Low-k Copper Interconnects for Advanced System-on-Chip (SoC). - Thierry Devoivre; M. Lunenborg; C. Julien; J.-P. Carrere; P. Ferreira; W. J. Toren; A. VandeGoor; P. Gayet; T. Berger; O. Hinsinger; P. Vannier; Y. Trouiller; et al. (MTDT, 2002)

Strain and layout management in dual channel (sSOI substrate, SiGe channel) planar FDSOI MOSFETs. - François Andrieu; Mikaël Cassé; E. Baylac; P. Perreau; O. Nier; Denis Rideau; R. Berthelon; Franck Pourchon; A. Pofelski; Barbara De Salvo; C. Gallon; Vincent Mazzocchi; et al. (ESSDERC, 2014)

Variability of UTBB MOSFET analog figures of merit in wide frequency range. - Sergej Makovejev; Babak Kazemi Esfeh; Jean-Pierre Raskin; Valeria Kilchytska; Denis Flandre; Vincent Barral; Nicolas Planes; Michel Haond (ESSDERC, 2014)

Effective work function engineering by sacrificial lanthanum diffusion on HfON-based 14 nm NFET devices. - Carlos Suarez-Segovia; Charles Leroux; Florian Domengie; Karen Dabertrand; Vincent Joseph; Giovanni Romano 003; Pierre Caubet; Stephane Zoll; Olivier Weber; Gérard Ghibaudo; Gilles Reimbold; Michel Haond (ESSDERC, 2015)

Static and dynamic power management in 14nm FDSOI technology. - Olivier Weber; Emmanuel Josse; J. Mazurier; Michel Haond (ICICDT, 2015)

Performance and layout effects of SiGe channel in 14nm UTBB FDSOI: SiGe-first vs. SiGe-last integration. - R. Berthelon; François Andrieu; P. Perreau; E. Baylac; A. Pofelski; Emmanuel Josse; Didier Dutartre; A. Claverie; Michel Haond (ESSDERC, 2016)

Back-gate bias effect on UTBB-FDSOI non-linearity performance. - B. Kazemi Esfeh; Valeria Kilchytska; Bertrand Parvais; Nicolas Planes; M. Haond; Denis Flandre; Jean-Pierre Raskin (ESSDERC, 2017)

Self-Heating in 28 FDSOI UTBB MOSFETs at Cryogenic Temperatures. - Lucas Nyssens; Arka Halder; Babak Kazemi Esfeh; Nicolas Planes; Michel Haond; Denis Flandre; Jean-Pierre Raskin; Valeriya Kilchytska (ESSDERC, 2019)