In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. - Chao Zhao; Gert Roebben; Hugo Bender; Edward Young; S. Haukka; Michel Houssa; Mohamed Naili; Stefan De Gendt; Marc M. Heyns; Omer Van der Biest (Microelectron. Reliab., 2001)

Fully coupled electron-phonon transport in two-dimensional-material-based devices using efficient FFT-based self-energy calculations. - Rutger Duflou; Gautam Gaddemane; Michel Houssa; Aryan Afzalian (Comput. Phys. Commun., 2025)