Characterization and Modeling of Gate-Induced-Drain-Leakage. - Fabien Gilibert; Denis Rideau; Alexandre Dray; François Agut; Michel Minondo; Andre Juge; Pascal Masson; Rachid Bouchakour (IEICE Trans. Electron., 2005)

Analog and RF modeling of FDSOI UTBB MOSFET using Leti-UTSOI model. - Salim El Ghouli; Patrick Scheer; Michel Minondo; Andre Juge; Thierry Poiroux; Jean-Michel Sallese; Christophe Lallement (MIXDES, 2016)