Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? - Mustapha Remmach; Romain Desplats; Philippe Perdu; J. P. Roux; Michel Vallet; Sylvain Dudit; P. Sardin; Dean Lewis (Microelectron. Reliab., 2004)

Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress. - Philippe Galy; Sylvain Dudit; Michel Vallet; Corinne Richier; Christophe Entringer; Frank Jezequel; E. Petit; J. Beltritti (Microelectron. Reliab., 2009)

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). - Guillaume Celi; Sylvain Dudit; Philippe Perdu; Antoine Reverdy; Thierry Parrassin; Emmanuel Bechet; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2010)

Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies. - Philippe Galy; Sylvain Dudit; Michel Vallet; Ph. Larre; M. Bilinski; E. Petit; J. Beltritti; A. Dray; Jean Jimenez; Frank Jezequel; R. Chevallier; C. Boutonnat; et al. (Microelectron. Reliab., 2010)

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. - Guillaume Celi; Sylvain Dudit; Thierry Parrassin; Philippe Perdu; Antoine Reverdy; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2011)

Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation. - Thierry Parrassin; Guillaume Celi; Sylvain Dudit; Michel Vallet (Microelectron. Reliab., 2011)