Exploiting an infrastructure IP to reduce memory diagnosis costs in SoCs. - Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (ETS, 2005)

Integrating BIST Techniques for On-Line SoC Testing. - Alberto Manzone; Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Ernesto Sánchez 001; Matteo Sonza Reorda (IOLTS, 2005)

Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores. - Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (MTV, 2005)

Test Considerations about the Structured ASIC Paradigm. - Paolo Bernardi; Michelangelo Grosso (DDECS, 2006)

Embedded Memory Diagnosis: An Industrial Workflow. - Davide Appello; Vincenzo Tancorre; Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (ITC, 2006)

On the Automation of the Test Flow of Complex SoCs. - Davide Appello; Vincenzo Tancorre; Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (VTS, 2006)

A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. - Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (VTS, 2006)

System-in-Package Testing: Problems and Solutions. - Davide Appello; Paolo Bernardi; Michelangelo Grosso; Matteo Sonza Reorda (IEEE Des. Test Comput., 2006)

Safety Evaluation of NanoFabrics. - Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (DFT, 2007)

An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. - Jorge Luis Lagos-Benites; Davide Appello; Paolo Bernardi; Michelangelo Grosso; Danilo Ravotto; Edgar E. Sánchez; Matteo Sonza Reorda (DFT, 2007)

On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. - Paolo Bernardi; Michelangelo Grosso; Ernesto Sánchez 001; Matteo Sonza Reorda (ETS, 2007)

Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems. - Paolo Bernardi; Michelangelo Grosso; Matteo Sonza Reorda (ACM Great Lakes Symposium on VLSI, 2007)

A System-layer Infrastructure for SoC Diagnosis. - Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (J. Electron. Test., 2007)

An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. - Davide Appello; Paolo Bernardi; R. Cagliesi; M. Giancarlini; Michelangelo Grosso (ETS, 2008)

Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors. - Paolo Bernardi; Kyriakos Christou; Michelangelo Grosso; Maria K. Michael; Ernesto Sánchez 001; Matteo Sonza Reorda (EvoWorkshops, 2008)

A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores. - Paolo Bernardi; Michelangelo Grosso; Ernesto Sánchez 001; Matteo Sonza Reorda (MTV, 2008)

A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. - Kyriakos Christou; Maria K. Michael; Paolo Bernardi; Michelangelo Grosso; Ernesto Sánchez 001; Matteo Sonza Reorda (VTS, 2008)

Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. - Davide Appello; Paolo Bernardi; R. Cagliesi; M. Giancarlini; Michelangelo Grosso; Edgar E. Sánchez; Matteo Sonza Reorda (ETS, 2009)

Exploiting embedded FPGA in on-line software-based test strategies for microprocessor cores. - Michelangelo Grosso; Matteo Sonza Reorda (IOLTS, 2009)

Evaluating Alpha-induced soft errors in embedded microprocessors. - Paolo Rech; Simone Gerardin; Alessandro Paccagnella; Paolo Bernardi; Michelangelo Grosso; Matteo Sonza Reorda; Davide Appello (IOLTS, 2009)

DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. - Davide Appello; Paolo Bernardi; Simone Gerardin; Michelangelo Grosso; Alessandro Paccagnella; Paolo Rech; Matteo Sonza Reorda (VTS, 2009)

Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. - Davide Appello; Paolo Bernardi; Michelangelo Grosso; Ernesto Sánchez 001; Matteo Sonza Reorda (IEEE Trans. Very Large Scale Integr. Syst., 2009)

An adaptive tester architecture for volume diagnosis. - Paolo Bernardi; Michelangelo Grosso; Matteo Sonza Reorda (ETS, 2010)

A software-based self-test methodology for system peripherals. - Michelangelo Grosso; Wilson J. Pérez H.; Danilo Ravotto; Edgar E. Sánchez; Matteo Sonza Reorda; Jaime Velasco-Medina (ETS, 2010)

An on-line fault detection technique based on embedded debug features. - Michelangelo Grosso; Matteo Sonza Reorda; Marta Portela-García; Mario García-Valderas; Celia López-Ongil; Luis Entrena (IOLTS, 2010)

Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. - Paolo Rech; Michelangelo Grosso; Fabio Melchiori; Domenico Loparco; Davide Appello; Luigi Dilillo; Alessandro Paccagnella; Matteo Sonza Reorda (IOLTS, 2010)

A novel scalable and reconfigurable emulation platform for embedded systems verification. - M. Di Marzio; Michelangelo Grosso; Matteo Sonza Reorda; Luca Sterpone; G. Audisio; Marco Sabatini (ISCAS, 2010)

A programmable BIST for DRAM testing and diagnosis. - Paolo Bernardi; Michelangelo Grosso; Matteo Sonza Reorda; Y. Zhang (ITC, 2010)

Functional test generation for DMA controllers. - Michelangelo Grosso; Wilson J. Pérez H.; Danilo Ravotto; Ernesto Sánchez 001; Matteo Sonza Reorda; Jaime Velasco-Medina (LATW, 2010)

A Fault Grading Methodology for Software-Based Self-Test Programs in Systems-on-Chip. - Oscar Ballan; Paolo Bernardi; Giovanni Fontana; Michelangelo Grosso; Ernesto Sánchez 001 (MTV, 2010)

Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug. - Paolo Bernardi; Michelangelo Grosso; Maurizio Rebaudengo; Matteo Sonza Reorda (IET Comput. Digit. Tech., 2010)

A Hybrid Approach for Detection and Correction of Transient Faults in SoCs. - Paolo Bernardi; Letícia Maria Veiras Bolzani Poehls; Michelangelo Grosso; Matteo Sonza Reorda (IEEE Trans. Dependable Secur. Comput., 2010)

Fault grading of software-based self-test procedures for dependable automotive applications. - Paolo Bernardi; Michelangelo Grosso; Ernesto Sánchez 001; Oscar Ballan (DATE, 2011)

An FPGA-Emulation-Based Platform for Characterization of Digital Baseband Communication Systems. - Jorge Luis Lagos-Benites; Michelangelo Grosso; Matteo Sonza Reorda; G. Audisio; M. Pipponzi; Marco Sabatini; V. A. Avantaggiati (DFT, 2011)

A Low-Cost Emulation System for Fast Co-verification and Debug. - Jorge Luis Lagos-Benites; Michelangelo Grosso; Luca Sterpone; Matteo Sonza Reorda; G. Audisio; M. Pipponzi; Marco Sabatini (ETS, 2011)

Functional Verification of DMA Controllers. - Michelangelo Grosso; Wilson-Javier Pérez-Holguín; Danilo Ravotto; Ernesto Sánchez 001; Matteo Sonza Reorda; Alberto Paolo Tonda; Jaime Velasco-Medina (J. Electron. Test., 2011)

A SBST strategy to test microprocessors' Branch Target Buffer. - Paolo Bernardi; Lyl M. Ciganda; Michelangelo Grosso; Ernesto Sánchez 001; Matteo Sonza Reorda (DDECS, 2012)

On-line software-based self-test of the Address Calculation Unit in RISC processors. - Paolo Bernardi; Lyl M. Ciganda; Mauricio de Carvalho; Michelangelo Grosso; Jorge Luis Lagos-Benites; Ernesto Sánchez 001; Matteo Sonza Reorda; Oscar Ballan (ETS, 2012)

Software-Based Testing for System Peripherals. - Michelangelo Grosso; Wilson-Javier Pérez-Holguín; Ernesto Sánchez 001; Matteo Sonza Reorda; Alberto Paolo Tonda; Jaime Velasco-Medina (J. Electron. Test., 2012)

On the use of embedded debug features for permanent and transient fault resilience in microprocessors. - Marta Portela-García; Michelangelo Grosso; M. Gallardo-Campos; Matteo Sonza Reorda; Luis Entrena; Mario García-Valderas; Celia López-Ongil (Microprocess. Microsystems, 2012)

A functional test algorithm for the register forwarding and pipeline interlocking unit in pipelined microprocessors. - Paolo Bernardi; D. Boyang; Lyl M. Ciganda; Ernesto Sánchez 001; Matteo Sonza Reorda; Michelangelo Grosso; Oscar Ballan (IDT, 2013)

On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors. - Paolo Bernardi; Riccardo Cantoro; Lyl M. Ciganda Brasca; Boyang Du; Ernesto Sánchez 001; Matteo Sonza Reorda; Michelangelo Grosso; Oscar Ballan (MTV, 2013)

Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment. - Michelangelo Grosso; Hipólito Guzmán-Miranda; Miguel A. Aguirre (IEEE Trans. Ind. Informatics, 2013)

Multi-domain simulation as a foundation for the engineering of smart systems: Challenges and the SMAC vision. - Renaud Gillon; Giuliana Gangemi; Michelangelo Grosso; Franco Fummi; Massimo Poncino (ICECS, 2014)

A new distributed framework for integration of district energy data from heterogeneous devices. - Francesco Gavino Brundu; Edoardo Patti; Andrea Acquaviva; Michelangelo Grosso; Gaetano Rasconà; Salvatore Rinaudo; Enrico Macii (DATE, 2015)

Addressing the Smart Systems design challenge: The SMAC platform. - Nicola Bombieri; Dimitrios Drogoudis; Giuliana Gangemi; Renaud Gillon; Michelangelo Grosso; Enrico Macii; Massimo Poncino; Salvatore Rinaudo (Microprocess. Microsystems, 2015)

A blocking probability study for the aethereal network-on-chip. - Guido Marchetto; Sarosh Tahir; Michelangelo Grosso (IDT, 2016)

A compact IGBT electro-thermal model in Verilog-A for fast system-level simulation. - Davide Lena; Michelangelo Grosso; Alberto Bocca; Alberto Macii; Salvatore Rinaudo (IECON, 2016)

Energy-efficient battery charging in electric vehicles with solar panels. - Michelangelo Grosso; Davide Lena; Alberto Bocca; Alberto Macii; Salvatore Rinaudo (RTSI, 2016)

Distributed Software Infrastructure for Evaluating the Integration of Photovoltaic Systems in Urban Districts. - Lorenzo Bottaccioli; Edoardo Patti; Michelangelo Grosso; Gaetano Rasconà; Angelo Marotta; Salvatore Rinaudo; Andrea Acquaviva; Enrico Macii (SMARTGREENS, 2016)

Training a classifier for activity recognition using body motion simulation. - Michelangelo Grosso; Davide Lena; Salvatore Rinaudo; David Alejandro Fernandez Guzman; Danilo Demarchi (BioCAS, 2017)

An energy-autonomous wireless sensor network development platform. - Michelangelo Grosso; Salvatore Rinaudo; Edoardo Patti; Andrea Acquaviva (DTIS, 2018)

Software-Based Self-Test for Transition Faults: a Case Study. - Michelangelo Grosso; Salvatore Rinaudo; Andrea Casalino; Matteo Sonza Reorda (VLSI-SoC, 2019)

Software-Based Self-Test for Delay Faults. - Michelangelo Grosso; Matteo Sonza Reorda; Salvatore Rinaudo (VLSI-SoC (Selected Papers), 2019)

An Investigation on Pervasive Technologies for IoT-based Thermal Monitoring. - Edoardo Giusto; Filippo Gandino; Michele Luigi Greco; Michelangelo Grosso; Bartolomeo Montrucchio; Salvatore Rinaudo (Sensors, 2019)

On the test of single via related defects in digital VLSI designs. - Nunzio Mirabella; Maurizio Ricci; Michelangelo Grosso (DDECS, 2020)

Comparing different solutions for testing resistive defects in low-power SRAMs. - Nunzio Mirabella; Michelangelo Grosso; Giovanna Franchino; Salvatore Rinaudo; Ioannis Deretzis; Antonino La Magna; Matteo Sonza Reorda (LATS, 2021)

A comparative overview of ATPG flows targeting traditional and cell-aware fault models. - Nunzio Mirabella; Andrea Floridia; Riccardo Cantoro; Michelangelo Grosso; Matteo Sonza Reorda (ICECS 2022, 2022)

Recent Trends and Perspectives on Defect-Oriented Testing. - Paolo Bernardi; Riccardo Cantoro; Anthony Coyette; W. Dobbeleare; Moritz Fieback; Andrea Floridia; G. Gielenk; Jhon Gomez; Michelangelo Grosso; Andrea Guerriero; Iacopo Guglielminetti; Said Hamdioui; et al. (IOLTS, 2022)

Targeting different defect-oriented fault models in IC testing: an experimental approach. - Nunzio Mirabella; Andrea Floridia; Riccardo Cantoro; Michelangelo Grosso; Matteo Sonza Reorda (DSD, 2023)

AMBEATion: Analog Mixed-Signal Back-End Design Automation with Machine Learning and Artificial Intelligence Techniques. - Giulia Elena Aliffi; Joao Baixinho; Dalibor Barri; Francesco Daghero; Nicola Di Carolo; Gabriele Faraone; Michelangelo Grosso; Daniele Jahier Pagliari; Jiri Jakovenko; Vladimír Janícek; Dario Licastro; Vazgen Melikyan; et al. (DATE, 2024)

Test mode selection and data I/O by means of a new Scan-based interface. - Andrea Floridia; Michelangelo Grosso (DCIS, 2024)

Machine Learning-based feasibility estimation of digital blocks in BCD technology. - Francesco Daghero; Gabriele Faraone; Michelangelo Grosso; Daniele Jahier Pagliari; Nicola Di Carolo; Giovanna Antonella Franchino; Dario Licastro; Eugenio Serianni (DTTIS, 2024)

Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test. - Riccardo Cantoro; Michelangelo Grosso; Iacopo Guglielminetti; Reza Khoshzaban; Matteo Sonza Reorda (ETS, 2024)

Predicting Digital Layout Success in Analog-on-Top Designs Using Machine Learning. - Francesco Daghero; Gabriele Faraone; Eugenio Serianni; Nicola Di Carolo; Dario Licastro; Giovanna Antonella Franchino; Michelangelo Grosso; Daniele Jahier Pagliari (NewCAS, 2025)