Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. - Egas Henes Neto; Ivandro Ribeiro; Michele G. Vieira; Gilson I. Wirth; Fernanda Lima Kastensmidt (SBCCI, 2005)

Single event transients in combinatorial circuits. - Gilson I. Wirth; Michele G. Vieira; Egas Henes Neto; Fernanda Gusmão de Lima Kastensmidt (SBCCI, 2005)

Generation and Propagation of Single Event Transients in CMOS Circuits. - Gilson I. Wirth; Michele G. Vieira; Egas Henes Neto; Fernanda Gusmão de Lima Kastensmidt (DDECS, 2006)

Single event transients in dynamic logic. - Gilson I. Wirth; Ivandro Ribeiro; Michele G. Vieira; Fernanda Gusmão de Lima Kastensmidt (SBCCI, 2006)

Using Bulk Built-in Current Sensors to Detect Soft Errors. - Egas Henes Neto; Ivandro Ribeiro; Michele G. Vieira; Gilson I. Wirth; Fernanda Lima Kastensmidt (IEEE Micro, 2006)

Accurate and computer efficient modelling of single event transients in CMOS circuits. - Gilson I. Wirth; Michele G. Vieira; Fernanda Gusmão de Lima Kastensmidt (IET Circuits Devices Syst., 2007)

Modeling the sensitivity of CMOS circuits to radiation induced single event transients. - Gilson I. Wirth; Michele G. Vieira; Egas Henes Neto; Fernanda Lima Kastensmidt (Microelectron. Reliab., 2008)