Semi-parametric methods for system identification. - Michiel Krüger; Eric Wemhoff; Andrew K. Packard; Kameshwar Poolla (Robustness in Identification and Control, 1998)

Electrical impedance tomography based sensors for semiconductor manufacturing. - Michiel Krüger; Kameshwar Poolla; Costas J. Spanos (ACC, 2002)

A class of impedance tomography based sensors for semiconductor manufacturing. - Michiel Krüger; Kameshwar Poolla; Costas J. Spanos (ACC, 2004)