Moisture absorption by molding compounds under extreme conditions: Impact on accelerated reliability tests. - Amar Mavinkurve; Jaume L. M. Llacer Martinez; Michiel van Soestbergen; Jeroen J. M. Zaal (Microelectron. Reliab., 2016)

Moisture diffusion rate in an ultra-low-k dielectric and its effect on the dielectric reliability. - Ning Duan; Vignesh Subramanian; Edgar Olthof; Paul Eggenkamp; Michiel van Soestbergen; Richard Braspenning (IRPS, 2021)

Transient Leakage Current as a Non-destructive Probe of Wire-bond Electrochemical Failures. - Md. Asaduz Zaman Mamun; Amar Mavinkurve; Michiel van Soestbergen; Muhammad Ashraful Alam (IRPS, 2023)

AI-Enabled Board Level Vibration Testing: Unveiling The Physics of Degradation. - Varun Thukral; Chen He; Rebecca Chen; Letian Zhang; Romuald Roucou; Michiel van Soestbergen; Jeroen J. M. Zaal; Rene Rongen; Willem D. van Driel; G. Q. Zhang (ITC, 2024)