A process for detecting defects in complicated patterns. - Masakazu Ejiri; Takeshi Uno; Michihiro Mese; Sadahiro Ikeda (Comput. Graph. Image Process., 1973)

An Automatic Position Recognition Technique for LSI Assembly. - Michihiro Mese; Takafumi Miyatake; Seiji Kashioka; Masakazu Ejiri; Isamu Yamazaki; Toshimitsu Hamada (IJCAI, 1977)

Direction-invariant methodology for bill pattern recognition. - Michihiro Mese; Hiroshi Sako; Takafumi Miyatake; Masakazu Ejiri; Hirotada Ueda (Syst. Comput. Jpn., 1996)